The Fastmicro Sample Scanner measures surface particle contamination levels indirectly using samplers. These samplers benefit the user by enabling them to take particle contamination samples at any time on various products and assemblies.
Indirect measurements with samplers holder
The Sample Scanner even allows robust measurements in places that are difficult to reach, and on relatively rough surfaces. The samplers (as certified by partner) collect particles from the surface, without leaving measurable residue behind.
The Sample Scanner measures the samples within seconds, which enables our customers to achieve an operator's workflow of less than a minute.
The samplers can be transported in a clean sampler holder, re-measured and further analyzed.
A particle fallout upgrade option is available for measuring particle deposition with the 1" wafer holder.
Consistent measurements in process
1. Fast: imaging takes seconds
2. Quantified: traceable digital output
3. Easy to operate: operator independent
a. Qualification in production by operators
b. Analysis, for advanced users in R&D
c. Monitoring, continuous and SPC
4. Accurate: high-resolution measurement (quantity, position, size)
5. Consistent: objective measurements, time after time
6. High throughput: processing within a minute
For more information about the Fastmicro Sample Scanner, please contact our sales department or come visit us at the booth.