MEMS probe card technology is one of the fastest-growing probing segments for some of the most innovative, leading-edge devices for 5G, Mobile, Automotive and IoT. Leveraging our proprietary MEMSFlexTM probe capabilities for a variety of probe card testing applications, Nidec SV TCL is
also continuing to discover new ways to solve challenging test issues with these probes, including new RF/High Current capabilities and memory testing.