Tektronix

Parametric insight, fast and clear.

Advancing your bold discoveries has never been easier. The 4200A-SCS Parameter Analyzer reduces the time from setup to running characterization tests by up to 50%, allowing uncompromised measurement and analysis capability. Plus, embedded measurement expertise provides unparalleled test guidance and gives supreme confidence in the resulting measurements.

Highlights

• Advanced measurement hardware for DC I-V, C-V, and pulsed I-V measurement types
• Begin testing immediately with hundreds of user-modifiable application tests included in the Clarius software
• Automated real-time parameter extraction, data graphing, analysis functions

Accurate C-V Characterization

Measure single-digit femtofarads with Keithley's newest capacitance-voltage unit (CVU), the 4215-CVU. By integrating a 1 V AC source into Keithley's industry-leading CVU architecture, the 4215-CVU offers low-noise capacitance measurements at frequencies from 1 kHz to 10 MHz.

Highlights

• First C-V meter in its class capable of driving a 1 V AC source voltage
• 1 kHz frequency resolution from 1 kHz to 10 MHz
• Measure capacitance, conductance, and admittance
• Measure on up to four channels with the 4200A-CVIV Multiswitch

Stable low current measurements for I-V Characterization

With the 4201-SMU and 4211-SMU modules you can achieve stable low current measurements in a high capacitance system. With four models of source measure unit (SMU) to choose from, the 4200A-SCS can be customized to meet all of your I-V measurement needs. By offering field Installable Units and optional preamplifier modules, Keithley makes sure that you can make the most accurate low current measurements with little to no downtime.

Highlights

• Add an SMU without sending the instrument back to the factory
• Make femptoamp measurements
• Up to 9 SMU channels
• Optimized for long cables or large chucks

A modern curve tracer solution

Install I-V Tracer Software to your 2400 Series Graphical SMU and create a functional replacement to traditional curve tracers like the Tektronix 576 or 370. Quickly trace out two-terminal device characteristics without configuring sweeps or connecting to other software.

Making the big power switch

Demand for more efficient high-voltage semiconductors in 5G, automotive, and alternative energy markets is driving increasingly complex testing and research into new technologies like SiC and GaN. Your testing equipment will need to evolve to keep up.

The 2470 SMU adds capabilities in measurements like breakdown voltage, leakage current, isolation testing, hi-pot and dielectric withstanding tests to get you to insight faster.

Make measurements at a whole new level

SMU instruments capture more-detailed device behavior and can characterize the device in extended ranges, so you can understand your device better, enhance its quality and improve its performance.

Highlights

• 6½-digit resolution precision source and measure
• 1 MSamples/s digitized measurement speed
• Current: 10 nA to 7 A DC, 10 A Pulse
• Voltage: 200 mV to 200 V
• Power: Up to 100 W DC to 1000 W Pulse

Intuitive UI. Smart and fast.

Measure, see and discover more on the intuitive, multi-touch user interface – from raw readings to histograms to time-based and voltage/current-based waveforms—and get to your answers more quickly.

Semiconductor materials used in power electronics are transitioning from Silicon to Wide Bandgap (WBG) semiconductors such as Silicon Carbide (SiC) and Gallium Nitride (GaN) due to their superior performance at higher power levels in automotive and industrial applications. Due to its high operating voltage levels, SiC technology is finding applications in EV power trains, whereas GaN is primarily used in fast chargers for laptops, mobile devices, and other consumer devices.

Key features and specifications

• 16 key measurements as per JEDEC and IEC standards
• Ability to test SiC or GaN devices as well as Si MOSFET and IGBTs
• Specify pulse regions such as the first, second, or multiple pulses of interest and correlate with the scalar results in the badge
• Annotations on waveforms to show the regions of interest
• Easily navigate the pulse region of interest for multi-pulse use case
• Unique edge refinement algorithm to analyze noisy waveforms
• Programmatic interface to all measurements and configurations enable the complete automation in test system applications
• Support of Auto and Custom reference levels helps to precisely identify Start and Stop regions effectively
• Hysteresis level configuration on the gate source helps to avoid false edges
• Quickly add and configure measurements through the intuitive drag and drop interface on the 4/5/5B/6B Series MSO
• Overlapped plot for Reverse Recovery (trr) measurement.
• Added search directions (forward, backward) for effective debugging of pulse regions.
• Deskew feature for switching analysis.

The application is designed based on the following standard references:

• Double Pulse Test (DPT)
  • IEC 60747-9
  • JEP182
  • IEC 60747-8

• Diode Reverse Recovery
  • JESD24-10
  • IEC 60747-9

Following measurements are performed:

• Low side switching parameters and High side diode reverse recovery measurements.
• Low side and High side switching parameters.

More details here: https://www.tek.com/en/datasheet/wide-bandgap-double-pulse-test-analysis-455b6b-series-mso-option-4wbgdpt5wbgdpt6wbgdpt-application

Ensure the highest power integrity

Precise characterization of Power Management ICs (PMIC), Power Distribution Networks (PDN), and Power Rails ensures that devices operate as designed and are well optimized. This power integrity analysis solution, enabled by either the 5 or 6 Series B MSO, includes probes and analysis tools you need to accelerate time to validation.

• Validate power supply sequencing
• Find sources of power rail ripple
• Correlate voltage, current and digital signals

More details here: https://www.tek.com/en/products/reference-solutions/power-integrity-analysis

Fast, Easy PCIe Lane Margining

The TMT4 Margin Tester complements existing Bit Error Rate Tester (BERT) and oscilloscope solutions for margin testing. Unlike BERT and oscilloscope systems, the TMT4 Margin Tester’s simple setup, configuration, and user interface minimizes the need for senior engineers to ensure systems are set up properly for testing, and enables a broader team of users to quickly assess the health of the link formed between Margin Tester and their DUT. Its targeted Tx/Rx capability allows you to capture issues with PCIe Gen 3 and Gen 4 communications on both ends of the link and enables teams to evaluate the link health of up to x16 Gen 4 links, across all PCIe presets 0-9, in minutes.

Simple Setup, Fast Results

Control the TMT4 Margin Tester using the front panel, a web browser, or the Rest API. Two scan options are available: Quick Scan and Custom Scan. Both include DUT Tx and DUT Rx tests. In Quick Scan, the Margin Tester and the DUT undergo a natural link negotiation to determine which presets to communicate over. Custom Scan is intended to provide users with more parameters to adjust for specific tests by forcing the DUT into specific presets for test.

Fast Results for Both Ends of the PCIe Link

With the TMT4 Margin Tester link health evaluation takes as little as two minutes.   

• The DUT Tx test provides 2 key pieces of data: eye diagrams for each lane-preset combination measured at the receiver of the Margin Tester and the associated receiver training values the Margin Tester used to open the eye that is displayed. 
• The DUT Rx test is a functional evaluation of the DUT’s receiver path. The test aims to determine how far the transmitted signal amplitude from the Margin Tester can be decreased, within an expected range of operation, before errors are returned.

A Full Suite of PCIe Adapters and Cables

The TMT4 Margin Tester supports most common PCIe form factors by means of 11 adapters available for CEM, M.2, U.2, and U.3. A single 16-lane ribbon cable with high density PCIe connectors connects the Margin Tester to any of the adapters, except for the M.2 edge adapter, which has its own integrated cable to accommodate different insertion loss specifications.