Focused Test designs, manufactures and supports a family of power discrete, power module and IC test systems for engineering and production test applications. Our company headquarters are located in Boulder, Colorado, USA and we maintain applications engineering centers in San Jose, Dallas TX and Palm Bay FL in the USA and in Focused Test Philippines Inc., Metro Manila.
Focused Test, Inc. (FTI) testers have a ‘Tester-per-Channel Board’ design which uses the USB bus to allow easy system scalability for single and multisite applications. FTI testers can be easily configured to perform parallel tests with many different types of multisite handlers, including gravity, turret and strip handlers. FTI’s highly flexible ‘FTI Studio’ software has a multi-threaded architecture which allows our testers to easily perform parallel tests in many different multisite test modes including Index Parallel, True Parallel and Ping Pong with minimum test-time penalty. Our test function library has an ‘Open Source’ architecture which gives the user additional flexibility to optimize or develop new test code.
In addition to best-in-class production test performance, FTI also offers a feature-rich range of software engineering tools. These include Scope Tool, Data/Curve Tracer Sheet Tool, TDDB and a Parts Average Test (PAT) Tool that implements the AEC Q001 Rev C standard.
FTI 1000 Power Discrete Test System
FTI 1000 tester consists of independent test channels that allow all DC and AC power discrete parameters to be tested either separately, or in one handler insertion/prober touch-down. The AC parameters tested by the FTI 1000 include Inductive Load/Switching (UIL/UIS), Gate Charge (Qg, Qgs, Qgd), Gate Resistance (Rg), Delta Vsd and Short Circuit Switching Tests. FTI 1000 is specifically designed to target Wide Band Gap power discrete test applications such as Dynamic Rdson test for GaN HEMT and Short Circuit Switching Tests for SiC Mosfet and JFET.
FTI 2000 Power Management IC Test System
FTI 2000 also uses a ‘Tester per Channel Board’ design to test a wide range power conversion IC’s with very low cost of test and high test floor scalability for multisite and multidie applications. FTI 2000 provides an innovative handler interface and docking solution for high test floor reliability with low cost of ownership.