JEOL USA, Inc.

11 Dearborn Rd
Peabody,  MA  01960-3823

United States
http://www.jeolusa.com
  • Booth: 5972


SEM, TEM, and E-beam Solutions for Innovation from JEOL

JEOL is a leading supplier of high throughput, high resolution Scanning and Transmission Electron Microscopes (SEM/STEM/TEM), shaped beam e-beam mask making tools, direct write ebeam tools, EPMA and Auger instruments, FIB and cross section polishing tools, and NMR and high resolution mass spectrometers. Visit our booth to learn more about JEOL ultrahigh resolution Field Emission SEM, how our customers are using our powerful ARM200F S/TEM and now the 300kV ARM300F for atomic resolution imaging & chemical mapping, and see the compact, versatile high throughtput SEM, the IT-100LV, in a demonstration. JEOL has installed more than 22,000 Scanning Electron Microscopes since the company introduced its first SEM in 1966.  


 Press Releases

  • JEOL's new JSM-IT100 is the latest addition to its InTouchScope Series of Scanning Electron Microscopes. Representing 50 years of industry leadership with advances in SEM and more than 22,000 SEMs installed, the IT100 is a simple-to-use versatile, research-grade SEM with a compact ergonomic design.

    Featuring expanded EDS analysis capabilities and ports for multiple detectors, the InTouchScope is a versatile workhorse SEM that can be configured to meet individual lab requirements at an exceptional value. It offers high resolution imaging and a range of acceleration voltages at both high and low vacuum modes.

    The IT100 is a remarkably intuitive, high throughput microscope designed to streamline workflow in any lab. Touchscreen operation, or traditional keyboard and mouse interface are at the operator's fingertips. Fast data acquisition make imaging and analysis of samples a simple task.

    With the IT100, it is simple to quickly obtain high quality images using both Secondary Electron and Backscatter Imaging. The embedded JEOL EDS system with silicon drift detector technology now includes Spectral Mapping, Multi-Point Analysis, Automatic Drift Compensation, Partial area, Line Scan, and Mapping Filter functions.

    JEOL's popular InTouchScope series includes the NeoScope benchtop SEM with selectable HV/LV and the JSM-IT300LV with advanced analytical capabilities and imaging of large, intact samples.

  • The new JEOL entry-level, high-performance Field Emission Scanning Electron Microscope JSM-7200F is a best-in-class FE SEM with ultrahigh spatial resolution of 1.6nm at 1.0kV and high probe current of 300nA. This versatile, user-friendly FE SEM is a compact system designed for easy installation and operation.

    Featuring through-the-lens detectors that can collect a variety of signals by varying the built-in energy filter, the JSM-7200F produces a large amount of data in a very short amount of time. For the fast-paced manufacturing environment the JSM-7200F is a high throughput easy-to-use FE SEM. For the research environment, it offers the analyst a wide variety of contrast mechanisms. Seamless observation and analysis using EDS, WDS, EBSD, STEM, BSE, and CL can be conducted easily and efficiently.

    The JSM-7200F is an all-in-one SEM designed for any type of sample or analysis, including magnetic samples, non-conducting materials, biological specimens, and semiconductor devices. It is the latest addition to JEOL's Field Emission SEM family, which includes the JSM-7800F PRIME with unmatched extreme high resolution and low and high kV (7Å at both 1.0kV and 15kV) operation.

    The JSM-7200F offers the best resolution in its class for an entry level Field Emission SEM with a wide variety of analytical functions, fast acquisition with minimum beam dwell time, and a user-friendly interface for a multi-user environment with remote operation and diagnostics.


 Products

  • Cross Section Polisher
    Ion Beam Polisher for SEM Samples...

  • JEOL’s Cross Section Polisher produces pristine cross sections of samples – hard, soft, or composites – without smearing, crumbling, distorting, or contaminating them in any way. Ideal for EBSD analysis. There is no precedent for a cross sectioning instrument of this type for SEM, EPMA, and SAM sample preparation.
  • Compact, High Resolution SEM
    The IT-100 InTouchScope is a versatile workhorse SEM with expanded EDS analysis capabilities. It offers high resolution imaging and a range of acceleration voltages at both high and low vacuum modes....

  • The IT100 is a remarkably intuitive, high throughput microscope designed to streamline workflow in any lab. Touchscreen operation, or traditional keyboard and mouse interface are at the operator's fingertips. Fast data acquisition make imaging and analysis of samples a simple task.

    With the IT100, it is simple to quickly obtain high quality images using both Secondary Electron and Backscatter Imaging. The embedded JEOL EDS system with silicon drift detector technology now includes Spectral Mapping, Multi-Point Analysis, Automatic Drift Compensation, Partial area, Line Scan, and Mapping Filter functions.

  • Ultrahigh Resolution Field Emission SEM
    Industry-leading FE-SEM for any type of sample, any type of analysis...

  • The JSM-7800F PRIME represents a significant leap forward in Field Emission SEM technology, with unmatched resolution and stability for imaging and analysis. JEOL's highest performance FE-SEM makes it possible to:

    • Observe the finest structural morphology of nanomaterials at 1,000,000X magnification with a 7Å resolution at 1kV
    • Collect large area EBSD maps at low magnifications without distortion
    • Perform low kV imaging and analysis of highly magnetic samples.
    • Image thin, electron transparent samples with sub 7Å in STEM-in-SEM mode.

 Additional Info

New Exhibitor:
No
New Products:
Yes
Displaying Equipment:
Yes
Product Demonstrations:
Yes
Please indicate which segment(s) your company serves
MEMS, Photovoltaic, Plastic/organic/flexible electronics, Semiconductor, Materials

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