Nanotronics Imaging

2251 Front Street
Suite 110
Cuyahoga Falls,  OH  44221

United States
http://www.nanotronics.co/
  • Booth: 417


Welcome to the Nanotronics Imaging e-Booth - see you soon!

Nanotronics is changing the way materials and electronics are manufactured. We automate industrial microscopes used for inspection of the world's smallest technologies: semiconductors, microchips, hard drives, LEDs, nano-fillers, nanotubes, and more. nSpec® is an integrated part of production processes at many of the world's leading manufacturers. nSpec® is powered by industrial enterprise software that provides scientists + engineers the first set of tools as advanced as the devices they build.


 Press Releases

  • Rapid Automated Macro Inspection and the first general Artificial Intelligence for the Semiconductor Industry

     

     

    San Francisco, CA- Nanotronics introduces nSpec® 2.0, a comprehensive inspection solution for fabrication plants and laboratories. nSpec® 2.0 has advanced machine learning and image processing algorithms that analyze fully patterned wafers and large devices. nSpec® can locate and classify any feature or defect from sub-nanometer through millimeters and centimeters.

    For decades the cost of operating a fabrication plant has risen exponentially. Tools at the convergence of the most advanced technologies—artificial intelligence, machine learning, and robotics, can radically transform the industry by reducing production and processing cost while increasing throughput.

    Leveraging software algorithms, machine learning, and AI to create a 21st century inspection system can result in massive cost reduction. Nanotronics’ systems are optimized for any stage of the process, with increased capacity and improved performance over time.

    Along with its striking industrial design, one of nSpec® 2.0’s key features is the first general-purpose Artificial Intelligence solution for the semiconductor industry. Nanotronics’ artificial intelligence software can be trained to both identity and classify new features and defects. The training requires extremely small data sets and the simple and intuitive user interface needs little operator training.

    Reliable, robust, and rapid inspection for a fraction of the cost of traditional inspection tools, the nSpec® 2.0 can inspect transparent, semi-transparent, and opaque materials at every stage of production including post-dicing and post-packaging. Nanotronics’ nSpec® integrates with existing systems including KLARF import/export and SECS/GEM.

    Nanotronics will debut this week at SemiconWest Rapid Automated Macro Inspection; providing high-throughput automated macro inspection of any wafer size, in less than one second, with ~75micron resolution, all contained in a small-footprint table-top system.

    These new features are in addition to the existing nSpec® fully automated optical inspection system. nSpec’s software already includes computational super-resolution, rapid non-contact 3D microscopy, atomic force microscopy, advanced image processing, and comprehensive analysis, making nSpec® 2.0 the most advanced automated optical inspection tool for every stage of production on the market.

     

    Visit SemiconWest 2016, Booth 417 July 12th-14th at the Moscone Center to learn how Nanotronics is laying the groundwork for the factory of the future.

     

    Nanotronics is an Inc 5000 company founded in 2010 by Matthew Putman, PhD and has offices in California, Ohio, and New York. The company is venture backed by Founders Fund, Morgan Stanley, and is a personal investment of Gordon Moore, Jaan Tallinn, and Howard Morgan. Nanotronics customers include Apple, Western Digital, Broadcom, Avago, ST Micro, IQE, II-VI, Soraa, Applied Optoelectronics, and others. All Nanotronics products are designed and manufactured in California.

    Nanotronics

    Contact: James Williams

    Phone: 347-217-8648

    Email: james@nanotronics.co

    Website: nanotronics.co

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 Additional Info

New Exhibitor:
No
New Products:
Yes
Displaying Equipment:
Yes
Product Demonstrations:
Yes
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Test, Sub-systems/Components/Parts

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