National Instruments Corporation

11500 N MoPac Expy
Austin,  TX  78759-3504

United States
http://www.ni.com/semiconductor-test-system/
  • Booth: 6386


Smarter Test With a Single Platform From Lab to Production

NI believes fundamentally that our customers know their requirements better than anyone and should be able to construct the system that exactly meets those requirements. They can do this with NI’s open platform, which combines three critical and interrelated elements: productive software, modular hardware, and an expansive ecosystem. Based on this open platform, NI's offering for semiconductor test customers ranges from cutting-edge RFIC characterization solutions to turnkey ATE systems with the NI Semiconductor Test System (STS). Our customers can use these solutions to meet the cost and time-to-market challenges of RF and mixed-signal IC test.

Ideal for IoT SoCs, RF front-end ICs, MEMS, or other ICs with strict analog and RF requirements, the customizable and open NI STS provides all the features customers expect from ATE, including handler/prober integration and system debug/calibration. The scalability of the NI platform opens the door for standardizing with a single underlying solution, from lab through production, to streamline workflow, maximize leverage, and simplify correlation.


 Press Releases

  • Latest release helps reduce measurement time by up to 33 percent

    AUSTIN, Texas – February 27, 2017 – NI (Nasdaq: NATI), the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, today announced NI-RFmx 2.2, the latest version of its advanced measurement software for PXI RF test systems. When used with the second-generation PXI Vector Signal Transceiver (VST), engineers can test 4.5G and 5G RF components such as transceivers and amplifiers using a wide range of carrier aggregation schemes, even as the 5G standard is still being defined.

    With the second-generation VST, engineers can simultaneously generate and measure up to 32 LTE carriers, each with 20 MHz of bandwidth, and use the software to specify a variety of carrier spacing schemes.

    The latest release of NI-RFmx also features algorithm improvements for reduced measurement time. Engineers performing modulation quality and spectral measurements for wireless technologies such as UMTS/HSPA+ and LTE/LTE-Advanced Pro can experience EVM measurement time reductions of up to 33 percent1 by installing the latest version of the software. The measurement speed improvements in NI-RFmx are part of NI’s continued efforts to help customers lower their cost of test with faster measurements.

    “By adopting PXI and LabVIEW along with NI-RFmx measurement software, we have seen many customers in the semiconductor industry significantly cut test time for RF measurements, resulting in lower cost of test and faster time to market,” said Charles Schroeder, vice president of RF at NI. “The combination of excellent documentation, wealth of example code, and tight integration with PXI hardware like the second generation VST has allowed our customers to quickly and easily adopt NI-RFmx into their test systems.”

    In addition to the algorithm improvements, NI-RFmx also adds enhanced support for measurements such as intermodulation distortion, third order intercept, and both Y-factor and cold source noise figure measurements. These measurements integrate easily with the PXIe-5668R RF signal analyzer so engineers can easily configure high-performance PXI intermodulation distortion and noise figure test sets. Current NI-RFmx users can click here to download and start using the latest version.

  • New PXI-based dual-channel arbitrary waveform generators and 8-channel oscilloscope help build smarter test systems

    AUSTIN, Texas – May 2, 2017 – NI (Nasdaq: NATI), the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced today the release of a new family of PXI arbitrary waveform generators with up to two channels and 80 MHz of analog bandwidth in a single slot, and a new 100 MHz, 8-channel oscilloscope that builds on NI’s expertise in high-density and software-designed instruments in PXI. Engineers can achieve high-performance signal generation and measure complex waveforms with these new low-cost, compact mixed-signal instruments in a modular form factor.

    The new PXIe-5413, PXIe-5423, and PXIe-5433 arbitrary waveform generators deliver -92 dB of spurious-free dynamic range and 435 fs integrated system jitter while providing precise waveform adjustment when used with a dedicated standard waveform generation engine. With a new fractional resampling architecture for arbitrary waveform generation, similar dynamic range and jitter performance is available independent of user sample rate. Users also benefit from the high-speed waveform streaming capabilities and multiple-instrument synchronization synonymous with PXI.

    Key features of the PXIe-54x3 arbitrary waveform generators include:

    • Up to two independently controlled output channels
    • Maximum ±12 V and minimum ±7.75 mV output ranges
    • Options for 20, 40 and 80 MHz in a single PXI slot

    The new PXIe-5172 oscilloscope includes a user-programmable FPGA. Engineers can use LabVIEW to customize this oscilloscope’s firmware, such as adding in-line signal processing or advanced triggering.

    Key features of the PXIe-5172 oscilloscope include:

    • Highly flexible with 100 MHz, 250 MS/s and 8 channels
    • Input voltage range of up to 80 V peak-to-peak with ±20 V DC offset
    • Support for external sample and reference clocks


    “Test engineers need the best technology available at the right price and channel counts to meet their cost, complexity and time-to-market requirements,” said Luke Schreier, director of automated test product marketing at NI. “The new family of arbitrary waveform generators provide software continuity with our NI-FGEN drivers for simple technology insertion, and the new oscilloscope includes a user-programmable FPGA to customize functionality for different applications. We believe the software-centric and standardized hardware approach in PXI for automated test, both in the laboratory and production environments, offers the flexibility to balance continuous innovation with proven measurement technologies.”

    PXI arbitrary waveform generators and oscilloscopes are important parts of the NI platform and ecosystem that engineers can use to build smarter test systems. These test systems are built on more than 600 NI PXI products ranging from DC to mmWave and feature high-throughput data movement using PCI Express bus interfaces and sub-nanosecond synchronization with integrated timing and triggering. Supported by a vibrant ecosystem of partners, add-on IP and applications engineers, the NI platform helps engineers lower the cost of test, reduce time to market and future-proof testers for tomorrow’s challenging requirements.

    Read this white paper to learn how new PXI arbitrary waveform generators deliver the right performance for smarter test systems and this white paper to learn more about how NI’s reconfigurable oscilloscopes address measurement challenges as part of smarter test systems.

  • New baseband Vector Signal Transceiver has 12X the bandwidth, a 50 percent smaller footprint and a larger user-programmable FPGA

    AUSTIN, Texas – June 6, 2017 – NI (Nasdaq: NATI), the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced today a baseband model of the second-generationVector Signal Transceiver (VST). The PXIe-5820 module is the industry’s first baseband VST with 1 GHz of complex I/Q bandwidth and is designed to address the most challenging RF front-end module and transceiver test applications, such as envelope tracking, digital pre-distortion and 5G test.

    "In 2016, NI disrupted the industry by introducing the RF model of our second-generation VST with 1 GHz of instantaneous bandwidth,” said Charles Schroeder, vice president of RF and wireless at NI. “We’re continuing the disruption with the baseband model of our second-generation VST. Engineers can use the baseband VST with LabVIEW system design software to address the evolving and changing needs of transceiver test applications. Engineers can take advantage of the software-designed architecture of NI’s VSTs to help accelerate the pace of design, reduce the cost of test and solve measurement problems previously unsolvable through traditional test approaches.”

    The PXIe-5820 combines a wideband I/Q digitizer, wideband I/Q arbitrary waveform generator and high-performance user-programmable FPGA into a single 2-slot PXI Express module. With 1 GHz of complex I/Q bandwidth, the baseband VST suits a wide range of applications including baseband I/Q testing of wireless and cellular chipsets as well as envelope tracking of digitally pre-distorted waveforms for power amplifier, and generation and analysis of new wireless standards such as 5G, 802.11ax and LTE-Advanced Pro.

    Product Features:

    • 1 GHz of complex I/Q instantaneous bandwidth for generation and analysis
    • Measurement accuracy to measure 802.11ax error vector magnitude (EVM) performance of -54 dB
    • Baseband 2-channel differential I/Q with 4 Vpp differential input and 2 Vpp differential output swing
    • FPGA-based measurement acceleration for measurements up to 10X faster and highly optimized measurement software
    • Compact size and tight synchronization of baseband and RF VSTs allowing for 2x2, 4x4, 8x8 or higher multiple input, multiple output (MIMO) configurations in the PXI form factor
    • Excellent noise floor and spurious free dynamic range
    • User-programmable FPGA that engineers can customize to add application-specific functionality
    • Ease of programming with consistent software experience between RF and baseband VSTs

    “The baseband VST is a deliberate evolution of our original software-designed architecture,” said Ruan Lourens, chief architect of R&D, RF at NI. “We have managed to optimize in every possible domain, from thermal and electrical to digital signal processing, to successfully deliver 1 GHz complex I/Q bandwidth in a small form factor. The baseband VST can be tightly synchronized with the PXIe-5840 RF VST to sub-nanosecond accuracy, to offer a complete solution for RF and baseband differential I/Q testing of wireless chipsets.”

    The baseband VST is a vital part of the NI platform and ecosystem that engineers can use to build smarter test systems. These test systems benefit from more than 600 PXI products ranging from DC to mmWave. They feature high-throughput data movement using PCI Express Gen 3 bus interfaces and sub-nanosecond synchronization with integrated timing and triggering. Users can take advantage of the productivity of the LabVIEW and TestStand software environments, along with a vibrant ecosystem of partners, add-on IP and applications engineers, to help dramatically lower the cost of test, reduce time to market and future-proof testers for tomorrow’s challenging requirements.

    To learn more about the baseband model of the second-generation VST, visit www.ni.com/vst/.


 Products

  • NI Semiconductor Test System
    The PXI-based NI Semiconductor Test System (STS) combines modular instrumentation and system design software for RF and mixed-signal production test....

  • The STS series features fully production-ready test systems that pack NI technology in a form factor suitable for a semiconductor production test environment. The STS combines the NI PXI platform, TestStand test management software, and LabVIEW graphical programming inside a fully enclosed test head. Its “tester in a head” design houses all the key components of a production tester including system controllers; DC, AC, and RF instrumentation; device under test (DUT) interfacing; and device handler/prober docking mechanics. This compact design eliminates the extra floor space, power, and maintenance required by traditional ATE testers that unnecessarily increase the cost of test. Additionally, with the open, modular STS design, you can take advantage of the latest industry-standard PXI modules for more instrumentation and computing power.

  • PXI Vector Signal Transceiver
    The PXI Vector Signal Transceiver (VST) combines an RF and baseband vector signal analyzer and generator with a user-programmable FPGA and high-speed serial and parallel digital interfaces for real-time signal processing and control....

  • The PXI Vector Signal Transceiver (VST) combines the flexibility of a software defined radio architecture and RF instrument class performance. You can use the VST to test a variety of cellular and wireless standards, and you can easily expand the VST's three-slot, 3U PXI Express form factor to support multiple input, multiple output (MIMO) configurations. The VST software is built on LabVIEW FPGA, and features several starting points for your application including application IP, reference designs, examples, and LabVIEW sample projects.
  • PXI Digital Pattern Instrument
    The PXI Digital Pattern Instrument delivers ATE-class digital to the industry-standard PXI platform for testing a broad range of ICs from RF front ends and power management ICs to transceivers and Internet of Things systems on chip....

  • The PXI Digital Pattern Instrument combines the function of pin electronics hardware for digital interfacing and DC parametric measurements with digital timing flexibility by bursting digital patterns based on vectors with defined timing sets and levels. Using various time sets on PXI Digital Pattern Instruments allows for specifying different periods and edge placement from one vector to the next within a pattern. The digital pattern instrument includes many more features that give test engineers the ability to create complete test programs for their devices and device families.

    The Digital Pattern Editor extends the hardware features of the PXI Digital Pattern Instrument as a tool for developing and editing files that comprise digital tests. The Digital Pattern Editor also adds powerful debugging features like History RAM tools, digital scope, real-time pin view, and system view, as well as a Shmoo tool for characterization and margining. The NI-Digital Pattern Driver is used to develop digital tests in LabVIEW software and .NET. The TestStand Semiconductor Module integrates test plan steps for all measurement types with results logging, database connectivity, part binning, and handler interfacing.


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