JEOL USA, Inc.

11 Dearborn Rd
Peabody,  MA  01960-3823

United States
http://www.jeolusa.com
  • Booth: 6064

SEM demo in booth, new E-beam tool, cross section perfection, and process gas analysis - join JEOL in booth #7111

JEOL is a leading supplier of high throughput, high resolution Scanning Electron Microscopes and Transmission Electron Microscopes (SEM/STEM/TEM), shaped beam e-beam mask making tools, direct write e-beam tools, EPMA and Auger instruments, FIB and cross section polishing tools, and NMR and high resolution Mass Spectrometers. Visit our booth to learn more about JEOL fast imaging and analytical SEM (bring your samples for an in-booth demo), and how our customers are using our powerful ARM200F S/TEM and now the 300kV ARM300F for atomic resolution imaging & chemical mapping. Explore gas analysis potential with the InfiTOF Mass Spectrometer. And learn how JEOL's 50 years of e-beam expertise has culminated in an all-new Direct Write E-Beam Lithography tool, the JBX-8100FS.


 Press Releases

  • The JEOL InfiTOF compact high-resolution gas analysis mass spectrometer is ideal for monitoring trace impurities in semiconductor process gases, evolved gases from catalytic reactions, vapor epitaxy and more.  No larger than a desktop PC, the InfiTOF instantly and identifies isobaric gases such as CO/N2,/B2H6, Ar/C3H4, Ne/HF, CO2/N2O/C2H4O, or PF3/CF4 for continuous monitoring without chromatography. “

    This Time-of-Flight Mass Spectrometer uses Multi-turn and Perfect focusing technologies to achieve high mass-resolving power in a very compact package.

    Designed for real time monitoring of directly introduced gas, this high mass-resolution mass spectrometer features stability for real time gas monitoring and elemental composition determination through accurate mass measurement. 

    Applications include analysis of gases used in semiconductor processing, vapor epitaxy and real-time monitoring of gases relevant to catalytic processes, battery technology and advanced materials. 

  • JEOL’s new IT200 series of Scanning Electron Microscopes are compact, versatile SEMs that deliver high resolution imaging with unsurpassed low kV performance and powerful software functionality, including “Zeromag” seamless transition from optical to SEM image, automated image montaging, report generation, and integrated image and analysis data management. The analytical models include JEOL’s fully-embedded EDS system which provides “Live Analysis” real-time EDS spectra during image observation.

    The IT200 delivers higher throughput than earlier models and operation is guided from sample introduction to automatic image formation. The IT200 series are compact, versatile SEMs that provide great value with the functionality of higher end microscopes. This smart, flexible, powerful SEM builds on the popular InTouchScope series with intuitive touchscreen interface and multiple analytical capabilities. 


 Products

  • Scanning Electron Microscope - IT200
    Demonstrations in booth 6064. High throughput, high resolution imaging, low kV and “Zeromag” transition from optical to SEM image. Enhanced automated image montaging, report generation, and integrated image and analysis data management....

  • JEOL’s new IT200 series of Scanning Electron Microscopes are compact, versatile SEMs that deliver high resolution imaging with unsurpassed low kV performance and powerful software functionality, including “Zeromag” seamless transition from optical to SEM image, automated image montaging, report generation, and integrated image and analysis data management. The analytical models include JEOL’s fully-embedded EDS system which provides “Live Analysis” real-time EDS spectra during image observation.

    The IT200 delivers higher throughput than earlier models and operation is guided from sample introduction to automatic image formation. The IT200 series are compact, versatile SEMs that provide great value with the functionality of higher end microscopes. This smart, flexible, powerful SEM builds on the popular InTouchScope series with intuitive touchscreen interface and multiple analytical capabilities. 


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