Ultra-Fast Magnetic Automated Testers for wafer-level probing of Magnetic Devices - MRAM (STT, SOT, VCMA) & Magnetic Sensors (TMR, GMR, AMR, Hall)
o MRAM - IBEX-WAT for Wafer Acceptance Test
o MRAM - IBEX-WS for Wafer Sort
o Magnetic Sensors - LINX-WS for Wafer Sort