Bowman Analytics

Schaumburg,  IL 
United States
https://bowmanxrf.com/
  • Booth: 5767

Overview

Bowman introduces ARCHER™, the most important software development in a decade for users of XRF analyzers.  ARCHER allows 1 instrument to provide precise coating thickness, composition and solution analysis. Software yields precise results regardless of the variable density that occurs over the bath’s life. Bowman instruments are IPC4552 A/B capable, and are best available XRF technology for ENIG/ENEPIG, HASL, %P. Bowman's 8 XRFs measure up to 5 layers; all have Silicon Drift Detectors for maximum peak resolution and shorter measurement times. “W” Series Micro XRF and (new!) cleanroom-ready A Series use poly-capillary optics to focus the beam to 7.5 µm FWHM -world’s smallest beam size for coating thickness analysis using XRF; ASTM B568, DIN 50987, ISO 3497, SEMI S8. “P” Series was engineered for large PCBs and flat panels; available with Large Window SDD. Multiple stage options accommodate widest range of sample sizes. Local support: service, recertifications, reference standards.  

  Products

  • W Series
    W Series is perfect for all wafer sizes and compatible with vacuum chucks....

    • ​Engineered for features < 100 um and down to 20 um and creates stage clearance for fixtures up to 100 mm tall. Sample size can be up to 300 mm x 400 mm for full XY stage coverage. Provides the best all-around performance and versatility with the smallest spot size, highest precision stage and and coverage of all wafer sizes. 
  • M Series
    Engineered for flat samples, wafers or PCB's....

    • ​Engineered for features < 100 um and down to 20 um. Sample size can be up to 400 mm x 400 mm for full XY stage coverage. 
  • A Series Micro XRF
    Provides best all-around performance and versatility with the smallest spot size....

    • ​Engineered for features < 100 um and down to 20 um and creates stage clearance for fixtures up to 100 mm tall. Sample size can be up to 600 mm x 600 mm for full XY stage coverage. Provides the best all-around performance and versatility with the smallest spot size, highest precision stage and largest sample capabilities. A Series instruments include 7.5 um optics with molybdenum anode tube and high resolution, large-window silicon drift detector. 

Categories

203 Inspection & Measurement Products
  • Film Thickness; Uniformity Measurement; Ellipsometer
  • Instruments; Bench Top Test
    • 700 Manufacturing Services
  • Calibration & Reference Standards
  • Certification; Compliance; Independent Laboratories
    • 701 Manufacturing Services or Consulting
  • Wafer Handling

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