TSI

Neukoellner Strasse 4
Aachen,  D-52068

Germany
https://www.tsi.com/semi
  • Booth: B1844


LOWER YOUR RISK AND DON'T FAIL AN AUDIT WITH TSI.


TSI, international leader in measurement technology for nearly 60 years and recognized leader in high-sensitivity particle counting, offers a range of instruments to reduce risk during fab processing by detecting sub-micron and nanoparticles that contaminate products in semiconductor manufacturing.

Minimize your risk, easily pass audits, and reduce product waste with new TSI AeroTrak®+ Remote Airborne Particle Counters—top-choice for uninterrupted, reliable particle counting during semiconductor or electronics manufacturing. Covered by an industry-exclusive 5-year laser warranty.

TSI also offers other high-sensitivity particle counting instruments. TSI 0.1 µm airborne particle counters and 10 nm cleanroom condensation particle counters are designed to meet the critical needs of the semiconductor industry by providing complete contamination detection ≥10 nm. TSI FMS Software with OPC UA Client/Server functionality makes it easy to exchange data to continuously monitor semi manufacturing cleanrooms—and pass audits.

In addition, MSP, a division of TSI, provides solutions for liquid source vaporization and calibration standards for defect inspection and metrology for semi manufacturing.


 Products

  • 10 nm PARTICLE MEASUREMENT LIKE NO OTHER
    AeroTrak 9001 Cleanroom CPC — Extremely low false-count rate provides accurate 10 nm measurements at low particle concentrations to confidently monitor mini-environments and process gases—keeping manufactured products safe from nanoparticle contamination....

  • TSI AeroTrak® 9001 Cleanroom CPC — 10 nm particle measurement like no other.


    0.1 μm particle counting instruments will not detect nanoparticle contamination—you need a CPC (condensation particle counter). Using TSI's decades of experience in CPC technology, the water-based TSI AeroTrak 9001 Cleanroom Condensation Particle Counter (CPC) is specifically designed for ultra-clean semiconductor manufacturing providing incredibly low false-counts, real-time nanoparticle detection, and 0.1 cfm flow rates for detecting particles in the air or inert pressurized gases. See video demo here.

  • EASILY PASS A CLEANROOM AUDIT
    Lower your risk and don't fail an audit — no matter what type particle counting you're needing, including continuous monitoring of semiconductor tools and mini-environments, periodic particle monitoring, and/or cleanroom classification....

  • The curent integrated circuit (IC) shortages demand more output from manufacturing processes, while industry leaders compete for smaller process nodes. These challenges require airborne particle contamination monitoring to ensure product is not at risk, output (yield) increases, and process does not fail cleanroom audits. Trust TSI no matter what type monitoring you need to maximize your processes.

    • Continuous monitoring of semiconductor tools and mini-environments. TSI FMS Software seamlessly integrates a range of instruments, including TSI AeroTrak® Portable Particle Counters, TSI AeroTrak+ Remote Particle Counters, and environmental sensors. Combined with the best-in-class features of TSI FMS Software, including OPC UA Client/Server, distributed databases, and hot standby, TSI provides the unparalleled flexibility and reliability for different information technology systems and software applications. These systems make it easy to communicate, exchange data, and use the information to continuously monitor semiconductor manufacturing cleanrooms for contamination.
       
    • Periodic particle monitoring of semiconductor cleanrooms. All TSI AeroTrak Portable Particle Counters operate as standalone instruments or as part of a facility monitoring system. The instruments can perform mobile periodic airborne particle monitoring and quickly identify risks in a semiconductor environment.
       
    • Semiconductor cleanroom classification. All TSI AeroTrak Portable Particle Counters are designed to simplify and speed up the cleanroom classification process. With ISO 14644-1 reporting built-in, TSI particle counting instruments provide an automated interface to easily complete the classification process.
  • WE DETECT ALL SIZE PARTICLES
    Particle measurement you can trust — 0.1/0.2/0.3/0.5 µm including 10 nm — to lower your risk and ensure you don't fail a cleanroom audit. We're an equipment supplier with nearly 60 years of particle counting technology experience—the industry's longest....

  • TSI provides high-sensitivity particle counting for almost 60 years —longer than any other particle counter company. TSI instruments are used worldwide in national standards laboratories that require superior accuracy, repeatability, and reliability. Don’t compromise your manufacturing process—trust TSI to detect it all.

    • 10 nm particle measurement. 0.1 μm particle counting instruments will not detect nanoparticle contamination—you need a CPC (condensation particle counter). Using TSI's decades of experience in CPC technology, the water-based TSI AeroTrak® 9001 Cleanroom Condensation Particle Counter (CPC) is specifically designed for ultra-clean semiconductor manufacturing providing incredibly low false-counts, real-time nanoparticle detection, and 0.1 cfm flow rates for detecting particles in the air or inert pressurized gases. See video demo here
       
    • 0.1 µm particle measurement. The 1 CFM TSI AeroTrak 7110 Remote Particle Counter and TSI AeroTrak 9110 Portable Particle Counter are trusted for their accuracy and reliability. In fact, both models include the industry’s best 4-year laser warranty.
       
    • 0.2 µm, 0.3 µm and 0.5 µm particle measurement. The TSI AeroTrak+ Remote Particle Counters and AeroTrak+ Remote Particle Counters with Pump include the industry’s best 5-year laser warranty. Simple installation, and the AeroTrak+ Remote Particle Counters with Pump do not require external vacuum sources. Power-over-ethernet or wireless connectivity further reduces cabling and installation overhead.

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