Afore Oy

Vakiotie 5
LIETO,  21420

Finland
http://www.afore.fi
  • Booth: 203


Welcome to MSTC, visit us to discuss your sensor test needs.

AFORE develops and produces application specific test solutions such as the test and calibration of MEMS devices.

We are specialized in custom and application specific wafer level test solutions delivering physical stimuli like acceleration, yaw-rate, vacuum and pressure enabling full characterization during development as well as complete test and trim operations in mass production.

As part of the AEM Group, we take pride in providing innovative, customer-focused solutions developing strong partnerships to cater for their engineering and manufacturing needs through our global support network covering Asia, Europe and the United States.


 Products

  • KRONOS
    KRONOS is a platform supporting applications that require motion or magnetic stimulus for wafer level and final test, i. e. inertial sensors with up to 9 DOF....

  • KRONOS is a platform supporting test and calibration of inertial sensors.

    Its unique setup including a fully automated wafer probe station inside of a 2-axis, infinite rotating inertial stimulus unit allows final testing of sensors at wafer level and CSP devices while eliminating unnecessary pick and place handling.

    An optional magnetic stimulus unit enables the system to process up to 9 DOF devices incl. accelerometer, gyroscope and magnetometer in one process step.

    The system can be configured for use in device characterization during development as well as for final test in mass production.

  • AIOLOS
    AIOLOS is a platform that supports a range of sensing applications requiring controlled environments or certain stimulus options for test and calibration. The system is capable to handle wafers and devices on wafer frames....

  • AIOLOS is a platform that supports a range of sensing applications requiring controlled environments or certain stimulus options for test and calibration.

    The flexible design, an extensive range of options and our experienced application development team allows us to tailor the system to specific customer requirements for existing and new applications. 

    Current stimulus options for test and trim include:

    ·         Pressure

    ·         Vacuum

    ·         Temperature

    ·         Humidity

    ·         Gas concentration

    ·         Blackbody source

    ·         3D magnetic field

    Handling options include testing of bare wafers, diced wafers, CSP’s (chip scale packages) as well as BGA’s and QFN’s on wafer frames.

  • METIS
    METIS is a rate-table platform enabling test and calibration of inertial modules in R&D and production environments. It supports simultaneous, infinite rotation of up to three axes and accurate device positioning at any axis angle....

  • METIS is a rate-table platform enabling test and calibration of inertial modules in R&D and production environments. It supports simultaneous, infinite rotation of up to three axes and accurate device positioning at any axis angle.

    The wide range of METIS configurations available support a number of applications in the field of inertial sensor testing and calibration, for example:

    • Characterization of acceleration or gyroscope sensors or inertial modules during development
    • Verification of software developed for inertial sensor applications
    • Low to mid volume production, especially when high accuracy is required

    The system can be controlled thru its own graphical user interface or remotely via TCP/IP.


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