July 12-14, 2016
San Fransisco, CA
Multi-Wavelength Ellipsometers for Thin Film Measurements
Film Sense Multi‐Wavelength Ellipsometers use long‐life LED’s and a no‐moving‐parts ellipsometric detector to provide fast and reliable thin film measurements in an easy‐to‐use, compact system.
The film thickness and index of refraction of most transparent thin films can be determined with excellent precision and accuracy by a simple 1 second measurement. Optical constants n & k and other film properties can also be measured for many samples.
Multi‐Wavelength Ellipsometry provides powerful thin film measurement capabilities, while at the price point of single wavelength ellipsometer and spectroscopic reflectometer systems. Film Sense ellipsometers are ideal for measurements in the research lab, classroom, in situ process chambers, industrial quality control, and more.