J.A. Woollam

645 M Street, Suite 102
Lincoln,  NE  68508

United States
  • Booth: 101

J.A. Woollam specializes in thin film characterization and have developed methods for accurate measurements on flexible materials using spectroscopic ellipsometry. Ellipsometry measures the refractive index and thickness of thin films and substrates. This is essential when developing new materials or monitoring your roll-to-roll deposition process. Stop by our booth to discuss your application.

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