Advantest (China) Co.,Ltd.

  • Booth: 4431

A world-class technology company, Advantest is the leading producer of automatic test equipment (ATE) for the semiconductor industry and a premier manufacturer of measuring instruments used in the design and production of electronic instruments and systems. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The company also focuses on R&D for emerging markets that benefit from advancements in nanotech and terahertz technologies, and has recently introduced multi-vision metrology scanning electron microscopes essential to photomask manufacturing, as well as a groundbreaking 3D imaging and analysis tool. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has subsidiaries worldwide.


  • V93000 Test System
    Leading Test Solution for AI and High-Performance Computing...

  • V93000 Wave Scale System, the single scalable platform for SoC devices, is a leader in AI and high-performance computation. 

    • Leading edge scan capabilities

    • Superior mix of DPS instruments

    • Test cell with active thermal control

    • High-speed instruments

  • B6700 Series Burn-in Testers
    Advanced Massively Parallel Burn-In Test for NAND and DRAM...

  • B6700ES incorporates all capabilities of the B6700 and B B6700D into a smaller configuration for engineering purpose, contributing to a reduced TAT (turn around time) from R&D to device production.

  • T5830 Series Memory Test System
    NAND and NOR Flash, and Emerging NVMs...

  • Economical Flash, Embedded Wafer and Final Test System

    • Fully optimized, scalable and economical flash solution
    • Effective resource utilization
    • Best CoT performance
    • Full functionality and flexibility for flash test
  • EVA100 Measurement System
    Low Cost Analog, Mixed-Signal and Digital ICs...

  • New software

    • Enhanced GUI experience
    • Test time improvement
    • AI test optimization

    New compact design

    • High test flexibility
    • Easy and fast maintenance
    • Scalable E to P model
  • T2000 Series Test System
    IoT / System-Level Test...

  • T2000 AiR system is a compact, air-cooled system optimized for low-cost testing in R&D and high-mix, low-volume production, offering broad test coverage for these diverse modules and system-in- package (SiP) devices.
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