SPEA Automatic Test Equipment

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Come discover latest testing solutions!

Established in 1976, SPEA is a world leader in the field of automatic test equipment. Its success results from a mix of experience and know-how, continuous investments in R&D, and a strategic insight. SPEA is the only ATE manufacturer whose product portfolio embraces all the phases of testing: from wafer test to packaged microchip, in-circuit, flying probe test on assembled PCBs. Product portfolio includes:

- Analog Mixed-Signal semiconductor testers, designed to drive down the cost of test of the devices of 50%, through a high-efficiency architecture

- Automated test cells for MEMS devices, combining pick&place handling, testing, contacting, and physical stimulus (rotating angular stimulus for inertial MEMS, pressure stimulus for pressure sensors, magnetic field for magnetic sensors), for single-function or COMBI MEMS

- Test Cells for Power Modules, MOS, IGBT - Flying Probe Testers, recognized as fastest and most accurate

- In-Circuit Board Testers, offering highest productivity


  • MEMS Test Cells
    SPEA test cells for MEMS devices combine fast pick&place handling, reliable DUT contacting and complete final test capabilities, including electrical test, physical stimulus for functional test and calibration, and tri-temp thermal conditioning....

  • All MEMS Test Cell elements are designed and manufactured directly by SPEA. The test cell works as a single equipment, performing test, handling and stimulus operations. Main advantages result in:

    • reduced costs, compared to solutions based on components from different suppliers

    • fast time to market

    • ease of use and maintenance, which means low cost of ownership

    • scalability and easy modification/extension of the equipment

    • High-throughput pick and place test handler (33,000+ UPH), specifically designed to perform gentle, fully automated handling of MEMS devices, without applying extra-force to the component. Components are picked up from trays or bowl feeder, wafer or strip on blue/UV tape, transferred to the test area and, at the end of the test, are placed on trays, reel or box

    • Stimulus units for testing inertial MEMS, environmental sensors (pressure, humidity, gas, temperature), TPMS sensors, magnetic and 9-DoF MEMS, optical sensors (proximity, ToF, UV sensors), MEMS microphones, with possibility of reconfiguration with different stimulus modules

    • Thermal conditioning, with an innovative nitrogen-less system

  • Power IC and Power Module Test Solutions
    SPEA’s Power Module Test Cell is the complete equipment to the production test of IGBT power modules. Tester architecture and instrumentation, in-line automation, contacting, software, are designed, manufactured, supported directly by SPEA....

  • SPEA Power Module Test Cells provide a turnkey solution for the automated handling, contacting and testing of IGBT modules, with the capability to force and measure the very high current and voltage values required for a complete, reliable test:

    • 2 test stations, one for AC and one for DC test

    • DC test capabilities 2500V/1000A

    • AC test capabilities 1000V/800A or 600V/1200A

    • parasitic inductance <60nH: over-voltage is always lower than breakdown

    • Dedicated CPU on HV/HI instruments and local set-up memory, for easier management of parallel function and shorter test time

    • Automatic spike detection to avoid damage on the DUT

    • Embedded alarms on the instruments

    • Current generators are internally parallelable, while voltage generators are internally stackable: this means no need for hardware on the load board

    • automated in-line handling for all module shapes

    • connection length is minimized to avoid stray inductance: no device damaging or overstressing during testing cycles

  • DOT100 - MEMS-Oriented Tester
    DOT 100 is an ultra-compact test system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost. DOT 100 can be directly integrated inside SPEA MEMS stimulus, docked to prober/handler, or used as rack....

  • DOT 100 is based on a revolutionary per-device architecture:

    - each device under test has a dedicated CPU managing the entire test process, in addition to dedicated device power supply and time measurement unit

    - each instrument card hosts all the resources for the parallel test of 3 devices

    All this is contained in a hand-carryable size, which offers a variety of uses:

    - integrated inside SPEA MEMS stimulus, DOT 100 provide direct tester/DUT connection, which results in signal integrity, higher test frequency, zero footprint

    - docking to prober

    - benchtop unit

    - rack for soft docking with handlers

  • 4050 - Tester for Probe Cards and Load Boards
    Automatic fixtureless test of probe cards, load boards and pogo towers allows you to minimize costs for diagnostics, field returns, repair...

  • 4050 Flying Probe Tester can deliver important quality and economical benefits to semiconductor industries, demonstrating to be the best machine for testing probe cards and load boards. It can be profitably used to test new probe cards and load boards before placing them in production (so to avoid the diagnostics directly on the mixed signal tester), to trouble shooting on field returns, to check-up for the remaining life of components (to avoid down time during production due to load board failures). SPEA 4050 can detect weak components, such as relays, in a very accurate and cost-effective way. Preventive test of components with defined lifetime allows the early identification of the ones that need to be replaced, avoiding their breakdown during production. The target of this preventive test - to be run at defined time intervals on production load boards - is to drastically reduce the failure of load boards during production test, with the related costs.
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