Focused Test invites you to booth 4651 to view GaN DRdson
Focused Test, Inc. (FTI) invites you to stop by booth # 4651 of our China distributor Nanovis Electronics Tecnologies.
FTI will demonstrate our FTI 1000 test system configured for Wide Band Gap and other power discrete applications, including GaN Dynamic Rdson, RBSOA, Eon/Eoff and GaN and SiC AC tests - Qg, Rg, Cg, UIS and Timing tests.
We also offer reliability test solutions, including Switching SOA testing of GaN devices.
FTI 1000’s flexible architecture provides the very fast switching speeds and data capture rates needed for next generation power discrete device tests including Multipulse Inductor Load tests. Our manufacturing test solutions include up to x16 multisite test of power discrete devices.
FTI 1000 can also be configured to test next generation Point of Load power conversion devices and components, including FET Gate Drivers and Controllers, and Half Bridge modules. FTI 1000 offers a fully integrated test solution including precision timing, high current, high voltage and dynamic FET tests.