FORM

Moscow, 
Russian Federation
http://www.en.form.ru
  • Booth: T2115


We assure confidence in the high quality of measurements

Established in 1992, FORM Co. Ltd. specializes in the design and manufacturing of Automatic Test Equipment (ATE) for IC, semiconductor and relay testing. Since its founding, FORM has steadily progressed in ATE and measurement technologies, and has become the major test systems and services supplier in the domestic Russian market.

94 companies in Russia use our equipment and test solutions in product and qualification testing, R&D, quality process analysis and incoming inspection. We are focused on the development and continuous improvement of test systems and services to meet your specific requirements and expectations. Our mission is to help our customers refine the quality of their products.


 Products

  • FORMULA® HF3 test system
    FORMULA® HF3 platform test systems are designed for final testing of a wide range of VLSI circuits: functional tests, DC and AC parametric tests....

  • FORMULA® HF3 platform test systems are designed for final testing of a wide range of VLSI circuits: functional tests, DC and AC parametric tests.

     Key technical characteristics  Description/value
     Devices under test  Logic, memory, microprocessors,
     microcontrollers, FPGA, ASICS
     Number of universal bidirectional pins  Up to 256/512
     Functional test frequency   Up to 200 MHz per pin
     Vector/error memory depth  Up to 64 M/64 M
     Overall Timing Accuracy (OTA)  Not more than ±700 picosec
     Range of logic levels  –2...+7.5 V

    The hardware, software, design and technological solutions realized in the systems provide characteristics and properties vital in making measurements, and in performing production tests and incoming inspection of VLSI circuits.

  • FORMULA® TT3 test system
    The FORMULA® TT3 test system is a universal testing and measuring system designed for comprehensive automated verification of the static parameters of semiconductor devices....

  • FORMULA® TT3 Test Systems have been created to carry out highly reliable measurements of the parameters of semiconductor devices: field effect and bipolar transistors and IGBTs, diodes, thyristors, voltage regulator diodes, optrons and microassemblies, as well as:

    • measuring capacitance: input, cross and output capacitance for field effect transistors and IGBTs;
    • measuring charge: gate-drain, gate-source and total charge for field effect transistors and IGBTs;
    • measuring individual parameters of passive components (L, C, R).

     Key technical characteristics  Description/value
     Number of operator posts  1
     Connection scheme  Four-terminal (Kelvin) sensing
     Voltage source and measure resources
     Range of specified and measured   voltage  ±100 mV…±2000 V
     Number of independent voltage source   and measure resources  10; 20; 200; 500; 800; 2000 V
     Error in voltage setting and measurement  from ±(0.5% + 10) mV
     Current source and measure resources
     Range of specified and measured current  ±100 nA…±100 А
     Number of independent current source   and measure resources  5 mA; 200 mA; 10 А; 100 А
     Error in current setting and measurement  from ±(1% ± 50) nA
     Low current mode  ±2 nA…±20 mA with error from   ±(0.4% + 400) pA
     Capacitance characteristics   measurement mode  from 0.1 pF to 100 nF
     Charge characteristics measurement   mode  from 10 pC to 2000 nC

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