MPI Corporation

Hsinchu County, 
Taiwan
http://mpi-corporation.com
  • Booth: 3151


Please visit website mpi-corporation.com for more info.

Founded in 1995 and headquartered in Hsinchu, Taiwan, MPI Corporation is a global technology leader in Semiconductor, Light Emitting Diode (LED), Photo Detectors, Lasers, Materials Research, Aerospace, Automotive, Fiber Optic, Electronic Components and more. MPI’s four main business sectors include Probe CardPhotonics AutomationAdvanced Semiconductor Test and Thermal Divisions. MPI products range from various advanced Probe Card Technologies, Probers, Testers, Material Handlers, Inspection and Thermal Air Systems. Many of these products are accompanied by state-of-the-art Calibration and Test & Measurement Software Suites. The diversification of product portfolio and industries allows a healthy environment for employee growth and retention. Cross pollination of product technologies allows each new innovation to provide differentiation in areas that are meaningful to our precious customer base.


 Products

  • TS3500 Series with WaferWallet™
    TS3500 and TS3500-SE are equivalent in features to MPI’s well-known and established TS3000 and TS3000-SE 300 mm probe stations with the added fully-automated capability by configuring or upgrading with MPI’s unique WaferWallet™....

  • Common practice for Device Characterization in the Modeling and New Technology Development processes is to extract data from a typical few wafers via extremely accurate IV-CV, 1/f, RF, mmW, and Load-Pull measurements. MPI’s WaferWallet™ extends the TS3500 series automation without compromising measurement capability. The WaferWallet™ is designed with five individual trays for manual, ergonomic loading of 150, 200, or 300 mm “modeling” wafers. Fully-Automated tests with up to five identical wafers at different temperatures are now possible.

  • ThermalAir TA5000A/B
    MPI Thermal localized temperature test products are used in applications such as semiconductor, microwave RF and other electronic component product design, development and thermal testing in engineering test....

  • MPI Thermal localized temperature test products are used in applications such as semiconductor, microwave RF and other electronic component product design, development and thermal testing in engineering test. MPI Thermal Test Systems are portable for bringing temperature capabilities to the test locations and easily integrated into existing test setups. We also design and manufacture thermal chambers, direct contact thermal systems and ultra-cold chillers. Our systems provide wide temperature range from -100°C to +300°C.

  • Cobra Probe Card
    MPI Cobra Probe Cards are a proven solution for a variety of semiconductor production tests including on wafer high volume manufacturing (HVM)....

  • MPI Cobra Probe Cards are a proven solution for a variety of semiconductor production tests including on wafer high volume manufacturing (HVM). Based on improved “Buckling Beam” technology – Cobra  , the cards are adapted for bond pad patterns such as full array, semi-array, peripheral and staggered – chip pattern. MPI’s technology has the world best overall cost-of-ownership (COO) for the following DUT packages :

    • Lead-free Bump
    • Copper Pillar (Cu Pillar)
    • Capped Pillar
    • Aluminum Pad

    MPI Cobra Probe Cards include high current carrying capability (CCC) and balanced contact force (BCF) . The technology is compatible with state-of-the-art space-transformer architectures. and is ready for applications requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, microprocessor, industrial microcontrollers, and more.

  • SkyWalker W1 Semi Auto Wafer/Chip Probe System
    The SkyWalker W1 Semi Auto Wafer Prober offers a complete integrated measurement solution for testing Photodiode (PD) wafers ranging from 2” to 6”. With a wide variety of optional wafer probing accessories, the precision-made SkyWalker W1 can be flexibly...

  • MPI provides an optimal and integrated solution for Photonics and optical devices manufacturing industry to reduce cost-of-test, increase system throughput, and enhance yield. The MPI probing technology creates an ideal modular platform combining robust mechanics and sophisticated test software specifically designed for APD, PIN PD, PSD, and InGaAs application. The SkyWalker W1 Semi Auto Wafer Prober offers a complete integrated measurement solution for testing Photodiode (PD) wafers ranging from 2” to 6”. With a wide variety of optional wafer probing accessories, the precision-made SkyWalker W1 can be flexibly configured to meet your specific requirements. 

  • Laser Cutter System
    The Laser Cutter System LCS-635 is designed for accurate and reliable Failure Analysis and Design Validation applications. Variable configurations based on 1064 nm, 532 nm, 355 nm or 266 nm wavelengths provides the capability to remove several...

  • The Laser Cutter System LCS-635 is designed for accurate and reliable Failure Analysis and Design Validation applications. Variable configurations based on 1064 nm, 532 nm, 355 nm or 266 nm wavelengths provides the capability to remove several semiconductor materials and metals selectively, see below the table.

    Available for ambient and/or hot only temperature operation modes the TS2000 is fast with speed up to 10 Dies/second (depends on the final configuration), which makes it an ideal choice for pre-production electrical tests on discrete RF devices, as example.

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