FORMULA® HF3 platform test systems are designed for final testing of a wide range of VLSI circuits: functional tests, DC and AC parametric tests.
| Key technical characteristics
| Devices under test
|| Logic, memory, microprocessors,
microcontrollers, FPGA, ASICS
| Number of universal bidirectional pins
|| Up to 256/512
| Functional test frequency
|| Up to 200 MHz per pin
| Vector/error memory depth
|| Up to 64 M/64 M
| Overall Timing Accuracy (OTA)
|| Not more than ±700 picosec
| Range of logic levels
|| –2...+7.5 V
The hardware, software, design and technological solutions realized in the systems provide characteristics and properties vital in making measurements, and in performing production tests and incoming inspection of VLSI circuits.