Bruker (Beijing) Scientific Technology Co., Ltd

Beijing, 
China
http://www.bruker-axs.com/stylus_and_optical_metrology.html?&L=3
  • Booth: 7146

R&D100 Award Winner! Technical Excellence!

Bruker Nano Surfaces Division provides the world''s most complete offering of AFMs and 3D non-contact optical and stylus surface profilers. Bruker''s nano surfaces metrology solutions support an enormous range of applications in research, product development, quality control and failure analysis, from advanced materials and semiconductor devices to LED, Solar Cell and automotive components.

Categories

203 Equipment, Inspection & Measurement
  • Microscopes: Atomic Force Microscopes (AFM)
  • Microscopes: Optical Microscopes
  • Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation
    • 205 Equipment, Nanotechnology
  • Equipment, Nanotechnology Tools
    • 208 Equipment, Test
  • Optical Test Systems
  • Wireless, non-contact Test Systems
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