MPI Corporation

Common practice for Device Characterization in the Modeling and New Technology Development processes is to extract data from a typical few wafers via extremely accurate IV-CV, 1/f, RF, mmW, and Load-Pull measurements. MPI’s WaferWallet^® extends the TS3500 series automation without compromising measurement capability. The WaferWallet^® is designed with five individual trays for manual, ergonomic loading of 150, 200, or 300 mm “modeling” wafers. Fully-Automated tests with up to five identical wafers at different temperatures are now possible.

MPI ThermalAir Series of Localized Temperature Test Systems are used for environmental test in applications such as Semiconductor, Microwave RF and other electronic/ non-electronic component product design, development and thermal testing in engineering test. MPI Thermal Test Systems are compact and portable for bringing precise temperature capabilities ranging from -100°C to +300°C to the test locations and are easily integrated into existing test setups with efficiency and performance. MPI Thermal also designs and manufactures Compact Chambers, Thermal End Effectors, Ultra-Cold Chillers, and wide range of Temperature Inducing Accessories to incorporate an intuitive full function for the ThermalAir users with the flexibility to accurately test at the thermal test workstation.

The EVS Probe Card ­is an enhancement over ­the­ conventional bucking beam probe card. ­Key features are­ higher C.C.C. and lower force. ­EVS can easily meet the requirement­ of advanced wafer probing. Precise alignment and­ excellence ­planarity control are the key factors­ contributing to stable contact resistance. With its capacity and performance, EVS Probe Card is­ an ideal choice for ­advanced probe cards.

MPI VEGA Series Wafer Probers provide precise and stable testing measurements over a wide temperature range.

The systems deliver low-noise measurement and multiple temperature testing capabilities that will be your ideal choice for optical sensing applications.

The VEGA series features a highly rigid and robust platform and selectable stations for fast and accurate measurements.

The system each allows a maximum of up to 3 test stations for measuring key optical characteristics such as LIV Sweep / Far-Field/ Near Field. The completely shielded chamber and dark enclosure enable optimal light-sensitive measurements.

MPI VEGA series wafer probers are available in manual, semi-auto, and fully-auto configurations to meet your application needs.