Teltec Semiconductor Pacific Limited

Hong Kong, 
China
http://www.teltec.asia
  • Booth: 3363


Welcome to TELTEC Pacific‘s booth - W5128 & 3351.

Teltec Semiconductor Pacific Ltd (www.teltec.asia) is a leading Sales & Service Organization serving the Semiconductor Industry (Front & Backend) for over 35 years.

Applications:

1) Substrate Activation/Cleaning: UVO Cleaners, Plasma Cleaning Systems

2) Failure Analysis: Bond Testers, Decapsulation Systems, SAM, IV Curve Tracers, IR Emission Microscopes, X-ray Inspection Machines

3) Reliability: Burn-in & Reflow Ovens, Centrifuges, Solderability Testers

4) IC Testing: Automated Wafer Probe Stations, IC Testers & Handlers, Harddockings, Interfaces, Manipulators

5) Photolithography: Mask Aligners, Nanoimprinters, Photoresists, Solar Simulators, Wafer Bonders

6) Metrology: AFM, Optical Profilers, Nanoindentors, Thin Film Thickness or Thermal Warpage & Strain Measurement Systems, VPD & Laser Stress Metrology Systems

7) Deposition & Etching: ALD, Plasma Deposition & Etching Systems, Sputtering & Evaporation Systems

8) Production: AOI Machines, Strip Grinders

 Products

Categories

200 Equipment, Assembly
  • Cleaning; Washing Equipment for Assembly & Packaging
  • Die Sorter; Pick & Place; Flip Chip Placement Systems
  • Lithography Systems for Wafer Level Packaging; Bumping; 3D Interconnect Aligners
  • Molding; Encapsulation; Decapsulation Equipment
  • Wafer Level Bonders
    • 203 Equipment, Inspection & Measurement
  • Acoustic Spectroscopy; Electron Spectroscopy for Chemical Analysis (ESCA); Ultrasonic; Acoustical Mi
  • Centrifuges
  • Die Inspection; Die Shear
  • Film Thickness; Thickness; Uniformity Measurement; Ellipsometer
  • Leak Detection Systems - Vacuum or Gas
  • Microscopes: Atomic Force Microscopes (AFM)
  • Microscopes: Optical Microscopes
  • Microscopes: Scanning Electron Microscope (SEM); Focused Ion Beam (FIB), Transmission Electron Micr
  • Resistivity Measurement; 4 point probe; Sheet resistance
  • Stress; Refractive Index; Reflectivity & Conductivity Measurement
  • Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation
  • Wire Bonding Inspection; Test
  • X-ray; XRF; 3-D X-Ray; LEXES Systems
    • 204 Equipment, Mems
  • Deep RIE etching; Dry Etching
  • Double sided mask aligner
  • Wafer Level Bonders
    • 205 Equipment, Nanotechnology
  • Equipment, Nanotechnology Tools
    • 207 Equipment, Process
  • Cleaning; Washing; Drying Equipment for Substrate, Fab Processing
  • Coat; Develop; Resist Processing; Track Equipment
  • Deposition; Chemical Vapor (CVD); MOCVD; PECVD; LPCVD; ALD; REALD; MVD
  • Deposition; Physical Vapor (PVD); Sputtering; Evaporation Equipment
  • Lithography; Exposure; Aligners; Direct Write Systems; Steppers; Scanners; Nanoimprint
  • SOI Bonders; Temporary Bonders; De-Bonders
  • Spin on Glass (SOG); on Dielectric (SOD) Track systems
    • 208 Equipment, Test
  • Burn-In Systems
  • Failure Analysis Systems
  • Handlers; Positioner Systems
  • Probing Equipment incl. Analytical; Circuit; Manual; E-Beam; Optical; Wafer Probers
  • System on a Chip (SOC); Mixed Signal Test Systems
  • Test Contactor Cleaning; Conditioning Systems
  • Test Head Manipulators and Docking Stations
    • 301 Materials, Chemicals & Solids
  • Photo Resist; Developers & Ancillaries (incl. Adhesion promoter (HMDS); Primer; Anti-Reflective Coat
    • 305 Materials, Nanotechnology
  • Materials, Nanotechnology
    • 307 Materials, Process
  • Photo Masks; Finished or Patterned
    • 308 Materials, Substrate
  • Compound Semiconductor substrates (GaAs on Silicon; GaN; InP; SiGe, etc.)
  • Prime; Polished; Mirrored Wafers
    • 309 Materials, Test
  • Burn-In Boards; Performance Boards (incl. Low; High Temp and Ceramic)
  • Probe Cards; DUT boards and other probing accessories (incl Ceramic and Special Purpose Probe Cards)
  • Test Sockets; Contactors and Contact accessories
    • 400 Components, Parts & Accessories
  • Lamps (non Lithography), all type UV; LED and other
  • Lamps for Lithography
    • 700 Manufacturing Services
  • Etch; Strip; Cleaning Service
  • Failure Analysis and other Analytical Services
    • 901 Solar
  • PV Manufacturing Equipment: Inspection and Metrology
  • PV Manufacturing Equipment: Thin Film
    • Back to the Search
    Loading ...

    :
    :


    Legend
    Available Timeslot
    Scheduled Appointment
    Personal Appointments
    Appointment Request
    Blocked Timeslot
    Restricted Timeslot
    Cancelled
    Declined
    For Technical Support with this webpage, please contact support.