NI

Shanghai,  China
http://www.ni.com/zh-cn.html
  • Booth: E4828

Overview

For more than 40 years, NI (www.ni.com) has developed automated test and automated measurement systems that help engineers solve the world’s toughest challenges. Let’s work together to find creative solutions to help your organization succeed today, tomorrow, and for the next 100 years.

Categories

208 Equipment, Test
  • Burn-In Accessory Systems
  • Burn-In Systems
  • Circuit Repair; Design Modification; Redundant Memory Repair; Mask Repair Systems
  • Discrete Component Test Systems
  • Environmental Stress Systems - Temperature; Humidity; Pressure; HAST
  • ESD; EMS and Latch-up Systems
  • Failure Analysis Systems
  • FPD Test; Measurement; Repair Equipment
  • Functional Test Systems
  • Handlers; Positioner Systems
  • Linear Test Systems
  • Logic Test Systems
  • Memory Test Systems
  • Optical Test Systems
  • Package Test Systems
  • Parametric Test Systems
  • Printed Circuit Board; Wire Board (PCB or PWB) Test and Repair
  • Probe Card Maintenance and Analysis Systems
  • Probing Equipment incl. Analytical; Circuit; Manual; E-Beam; Optical; Wafer Probers
  • System on a Chip (SOC); Mixed Signal Test Systems
  • Test Contactor Cleaning; Conditioning Systems
  • Test Head Manipulators and Docking Stations
  • Wireless, non-contact Test Systems
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