Gazer Semiconductor Tech Co., LTD

Shanghai,  China
https://www.gazersemi.com
  • Booth: 2342

Overview

Gazer Semiconductor independently developed FTIR film thickness measuring equipment, FTIR element concentration measuring equipment, EDXRF film thickness measuring equipment, etc.    The equipment can be compatible with the second/third generation semiconductor wafer measurement, such as Si and SiC, etc., with high detection efficiency, good safety performance, low maintenance cost, easy to use and other advantages.    The device can be customized and developed according to customers' usage scenarios to better adapt to customers.


  Products

  • Wafer Epitaxial Layer Film Thickness Measurement
    Fully developed in-house by GazerSemi, our equipment comprises an optical system, an automated wafer inspection platform, and proprietary semiconductor analysis software....

  • Fully developed in-house by GazerSemi, our equipment comprises an optical system, an automated wafer inspection platform, and proprietary semiconductor analysis software. The device, compact indesign, incorporates a multi-axis robot that employscomposite movements for material manipulation.The innovative Stage design substantially boostsinspection effciency while simultaneously reducingmaintenance overheads. With the aid of our unique measurement algorithm, the precision of measurement is signifcantly enhanced.  An internal designfeaturing a gas fow structure guarantees wafer clean-liness during transit, Safety is paramount; hence, weemploy multiple interlock systems to ensure securewafer transportation and safeguard both personneland equipment.