Advantest (China) Co.,Ltd.

Shanghai,  China
https://www.advantest.com/CN/index.htm
  • Booth: 4431

Overview

Advantest (TSE: 6857) is the leading manufacturer of automatic test and measurement equipment used in the design and production of semiconductors for applications including 5G communications, the Internet of Things (IoT), autonomous vehicles, high-performance computing (HPC), including artificial intelligence (AI) and machine learning, and more. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The company also conducts R&D to address emerging testing challenges and applications; develops advanced test-interface solutions for wafer sort and final test; produces scanning electron microscopes essential to photomask manufacturing; and offers system-level test solutions and other test-related accessories. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. More information is available at www.advantest.com.

  Products

  • V93000 EXA Scale™
    V93000 EXA Scale SoC Test Systems are targeted at advanced ICs up to the exascale performance class, enabling new test methodologies to meet the challenges of advanced devices and deliver lower Cost-of-Test and faster Time-to-Market....

    • The V93000 Wave Scale RF (WSRF) solution addresses these requirements for RF and millimeter wave applications including Cellular 5G / 5G Advanced / NR RedCap, WiFi 6/6E/7, UWB, Bluetooth, GPS, ZigBee, WiGig, Sparklink and many other upcoming standards, across all device types, including transceivers, power amplifiers, modules and RF-SOCs.
    • XPS256, Pin Scale 5000 and Link Scale prepare us for future challenges posed by applications like AI, HPC and mobile.
    • The PowerMUX (PMUX), AVI64, and FVI16 further expand the usage of the single scalable V93000 test platform with uncompromised features such as high-density instrumentation enabling cost efficient parallel testing as well as universal per pin architecture. The floating design of the instruments enables testing of high- and low-side power structures, and the fully pattern-based operation maximizes the test throughput.
  • T2000/T6391 SoC Test Systems
    T2000 platform adopts a module architecture and can be flexibly reconfigured by rearranging the necessary functional modules according to the application. T6391 enables cost-efficient testing of display driver ICs for high-resolution flat-panel displays....

    • T2000’s rich variety of functional modules, including digital, high-performance analog, power-mixed signals, and image capture, provide a wide range of test coverage and offer solutions at optimal cost. This makes it possible to have a scalable system configuration ranging from an air-cooling system with 9 slots to a liquid cooling system with 52 slots and up to 8,192 channels. T2000 provides compact solutions with reduced initial investment for development and small lot productions, and high-efficiency multiple-DUT parallel measurement solutions for mass productions.

    T6391 provides wide test coverage for all types of applications including analog, memory and logic circuits with high pin counts and high-speed interfaces. T6391 was developed to address both the current and future needs of customers worldwide. It is capable of testing Touch and Display Driver Integration (TDDI), PMIC functions embedded within DDIs, a projected advancement in next-generation devices.

  • CREA MT System
    MT System is a configurable test equipment suitable to verify static and dynamic parameters of power semiconductors (ex. IGBT, MOSFET, DIODE, SiC, GaN) packaged and unpackaged (discrete, module and substrate)....

    • The CREA product portfolio, combined to specific patented technologies (PCI, RTH,LSI), provide a reliable test solution that can be used from laboratory to mass production. All the CREA’s products portfolio allow integration with any automatic handler for high volume production for module and KGD testing needs.

    • Modular hardware and software
    • ISO/DC/AC/SC test in accordance with IEC 60747 standard for bare dice (KGD), module and discretes
    • High test voltage up to 10 kV
    • High current capability up to 18 kA

Categories

203 Equipment, Inspection & Measurement
  • Microscopes: Scanning Electron Microscope (SEM); Focused Ion Beam (FIB), Transmission Electron Micr
    • 205 Equipment, Nanotechnology
  • Equipment, Nanotechnology Tools
    • 208 Equipment, Test
  • Failure Analysis Systems
  • Functional Test Systems
  • Handlers; Positioner Systems
  • Linear Test Systems
  • Logic Test Systems
  • Memory Test Systems
  • Package Test Systems
  • Parametric Test Systems
  • System on a Chip (SOC); Mixed Signal Test Systems
    • 305 Materials, Nanotechnology
  • Materials, Nanotechnology
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