JEOL Ltd.

Akishima-shi,  Tokyo 
Japan
http://www.jeol.com
  • Booth: 2722

We look forward to meeting you at the JEOL booth.

  Products

  • JSM-IT810
    Versatility and high spatial resolution meet automation with the JSM-IT810 series FE-SEM. No-coding automation for imaging and EDS analysis is built-in for a streamlined and efficient workflow....

    • Versatility and high spatial resolution meet automation with the JSM-IT810 series FE-SEM.
    No-coding automation for imaging and EDS analysis is built-in for a streamlined and efficient workflow.
    New functions are available to ensure high quality data and an enhanced user experience for all SEM users.
    Functions include the SEM automatic adjustment package, a trapezoidal correction function (useful for EBSD measurements) and Live 3D surface reconstruction for observation of surface topography.
    Operating a FE SEM has never been easier with the JSM-IT810 series.

Categories

203 Equipment, Inspection & Measurement
  • Microscopes: Scanning Electron Microscope (SEM); Focused Ion Beam (FIB), Transmission Electron Micr
    • 207 Equipment, Process
  • Lithography; Exposure; Aligners; Direct Write Systems; Steppers; Scanners; Nanoimprint
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