Marposs NCGR is a gauge to measure thickness based on refelctometric technology: light waves, which are reflected at the layer boundaries of different surfaces, generate different waveforms according to the multilayer stack and the thickness of each layer.  Once trained on multilayer composition the system is able to recognize the thickness of the targeted layer on a range having a lower limit of few nanometers.

In the past, the measurement of nanometric thicknesses occurred almost exclusively downstream of the machining operations. But today, with the improvement of machine tool controls, such extremely accurate measurements can be performed straight in the production phase. Relying on its decades of experience, MARPOSS has developed specific probes and software for use during target machining process

BENEFITS

• Provides non-contact thickness measurement of nanometric layers.
• Reat time mesurement during the machining process

Horizon is the next-generation interferometric controller designed to meet the highest precision measurement demands in the semiconductor, 3C (Computer, Communication, Consumer electronics), and other high-precision industries. Combining cutting-edge technology with long-term stability, Horizon ensures unmatched accuracy down to the nanometer level. Whether for in-line production control or laboratory dimensional inspections, this advanced solution is engineered to deliver reliability and performance in the most demanding applications.

Horizon is designed for industries where precision measurement is critical to process optimisation, waste reduction and quality improvement. In the semiconductor industry, Horizon plays a critical role in ensuring precise wafer positioning during production, maintaining optimal flatness control and aligning lithography masks with extreme accuracy. These capabilities are essential to achieve the high performance and miniaturisation required in modern semiconductor manufacturing.

For the 3C industry, Horizon provides a powerful solution for testing and inspecting electronic components and devices. From ensuring the reliability of microchips to verifying the structural integrity of consumer electronics, its advanced measurement capabilities contribute to the consistent quality and durability of high-tech products.

In the EV market segment, we may offer solutions to measure for example paint thickness on battery cells and coating thickness on magnet wire.

With the ability to adapt to various surfaces and materials, including highly reflective and transparent ones, interferometric technology is an indispensable choice for industries where precision, reliability, and measurement speed are critical.

ZENITH controller is the new reference for chromatic confocal controllers adapted to the industrial environment. Based on the Ethernet standard communication, it allows high precision measurements without contact and without risk of altering the parts.Its ease of use and implementation are designed to operate 24/7 (24 hours a day, 7 days a week, 52 weeks a year).

Among the various advantages of ZENITH is the measurement of distance and thickness at very high resolution on all types of surfaces and materials, including reflective surfaces.

ZENITH controller is composed of the new generation of components which, in combination with the large variety of STIL point sensor heads, allow to offer excellent metrological performances (down to the nanometer).

Built according to the highest quality standards since 2022, ZENITH controller is a robust and reliable product suitable for use in industrial and laboratory environments.

This reference is available at a maximum frequency of 5000Hz to provide solutions in multiple application contexts and on any type of surface reflectivity: transparent or opaque, bright or diffuse.

BENEFITTS

Enhanced performances via higher dynamic (15 bits)

Industrial solution with Ethernet connection (GigE)

Up to five encoders input, perfect for CMMs

Synchronization: Master&Slave mode for multi-sensor measurements, encoder trigger feature

Configuration via software or embedded web server

Chromatic confocal technology can measure any material capable of reflecting white light (e.g. metal, glass, plastic, paint films, liquids)

Non-contact measurement is suitable in all cases where it is necessary to measure without touching the target

High measurement accuracy

Interchangeable STIL optical heads: CL-MG / OP / ENDO / EVEREST series

ZENITH controller can save up to 20 maps to allow the use of the most appropriate probe

Our Visual Blade Inspector (VBI) sensor, engineered to revolutionize wafer cutting operations, is designed for precision and reliability and continuously monitors blade performance during cutting, ensuring consistent quality and minimizing waste. With advanced sensor technology, it provides real-time measurement of blade wear and shape, reduces scrap, and seamlessly integrates into existing workflows.

The dicing process involves several fundamental aspects from the point of view of the sensor monitoring the blade.

The sensor checks the position of the blade (NCS) to ensure that it is aligned correctly with respect to the wafer, because incorrect positioning can cause defects in the chips. We are significantly faster than the competition while maintaining excellent repeatability.  During the process, the data collected by the sensor is analysed in real time to detect blade breakage (BBD), thus improving the quality of the cut and the overall efficiency of the process. The sensor also monitors the level of blade wear and can alert the operator or activate an automatic replacement system when the blade begins to wear.

Our sensor is connected to an  electronic interface unit, which can handle two sensors at the same time: they can do the same function, or even two different functions.

BENEFITS

Advanced Monitoring enhances process reliability

NCS Cycle High speed for positioning with excellent repeatability

High Sampling Speed Images captured in rapid succession for up-to-date monitoring

Advanced BBD Algorithm : Quick detection of blade breaks with water filtration,reduced false alarms

Better Signal Transmission no fiber optics reducing issues related to fragility

Reduced Downtime With a range of 1.8mm minimises positioning times and optimises productivity

Simple Integration easily integrates with your machines without complex modifications

Intuitive Configuration Can be easly programmed through the integrated Web Server

Advanced features automatic operations for probe setup according to ambient light conditions