Polytec GmbH

Polytec-Platz 1-7
Waldbronn,  D-76337

Germany
http://www.polytec.de
  • Booth: A4665


Ihr Partner für Optische und Elektrische Messtechnik

Polytec provides instruments and components for a variety of semiconductor measurement applications:
Four-Point-Probes (sophisticated fully automated systems as well as simple manual systems), CV mapping, optical and photothermal layer thickness measurement, InGaAs cameras, UV curing systems, fiberoptic sensing (temperature, strain, vibration), machine vision components as cameras, lenses, illumination and software packages. Laser-Doppler-Vibrometry, MEMS Vibration and Motion Analysis, Wafer-level MEMS Test Solutions, Surface Profilometry and Topography Measurement.
 


 Press Releases

  • Polytec presents the new thickness measurement system from the French manufacturer Enovasense.

    The system has been developed for determining the thickness of non-transparent and semi-transparent layers and is based on thermophysical measurement principles. This makes it suitable for almost all layers on common substrates such as paints, electroplating and metal coating on plastic, metal, wood or glass.  

    The process suitability is unique, in many areas permitting a 100% quality control where this has not previously been possible: extremely short measurement times of less than one second, the contactless, non-destructive photothermal measurement process, the compact sensor head (75 x 32 x 41 mm) and scalability with the ability to control up to 10 parallel sensor heads all play their part. Robotic arm installation can also be easily used with this system.

    Examples of typical applications can be found in the plastics or metal processing industry for metallic plastic coatings and electroplating or in the aeronautics industry for measurements on coated composite materials. A special, patented application is used in the automotive industry to measure the thickness of metallic cylinder coatings.

    Polytec offers exclusive advice, feasibility studies, sales and service for the German-speaking region.

    www.polytec.de/enovasense


 Products

  • 4 point probe MO-280SI
    4 point probe for silicon solar cell applications Polytec shows the 4-point probe model 280SI which was specially developed for the photovoltaic sector. It can be used to determine the leakage current of a solar cell directly after the diffusion step....

  • 4 point probe for silicon solar cell applications

    Polytec GmbH from Germany will  presents a modified version of the 4-point measuring system Model 280SI which was specially developed for the photovoltaic sector.

    In addition to the classic application of surface resistance measurement, the MO-280SI can also be used to determine the leakage current of a solar cell directly after the diffusion step. Another measure that extends the functionality is the contact resistance at the junction of the electrodes to the solar cell - another important parameter for assessing the efficiency of the cell. In conjunction with the sheet resistance measurement, it is possible to make concrete statements about the quality of the solar cell. In addition, the P / N type recognition was optimized and adapted to the higher requirements of the silicon solar cell.

    Polytec, the exclusive distributor and service partner of the US manufacturer 4 Dimensions, will be demonstrating a 4-point measuring station in live operation.

  • CV / IV measurement systems
    Mercury contact CV and IV measuring systems from Polytec open up to you the sheer diversity of electrical characterization of a wide range of layers such as oxides, dielectrics, layers on conductive and insulating substrates or of SOI wafers....

  • Mercury contact CV and IV measuring devices from Polytec open up to you the sheer diversity of electrical characterization of a wide range of layers such as oxides, dielectrics, layers on conductive and insulating substrates or of SOI wafers.

    The special scan head concept offers you a repeatable and precise, defined contact area variable, combined with outstanding safety and tidiness when handling mercury, the contact material. Depending on the application, you can implement an extremely wide range of contact geometries.

    The multitude of possible measurement methods allows you to characterize a wide range of samples, such as.

    • Monitoring Oxide Integrity and Quality

    • Creating Doping Profiles

    • Measuring Charge Carrier Service Lives

    • Determining the Resistances of Practically Insulating Materials

    • Characterizing SOI Structures

    • Examining Ferroelectric Materials

    • Characterizing Polysilicon

    Rectangular pulses are used to measure the practically static and HF capacities. To name but one example, the advantages lie in the insensitivity to the series resistance.

    Connections for existing external HF sinusoidal sources increase flexibility in use.

  • OmniCure® UV flood lamp 200 x200 cm
    Excelitas' OmniCure® systems are developed for industrial UV curing applications. The new flood lamp covers a curing area of 200 x 200 cm with a uniformity of +/- 10% and is particularly suitable for use with wafers and solar cells....

  • Excelitas' OmniCure® systems for industrial UV curing applications cover UV curing from point to line to area application - with both intelligent arc lamps and state-of-the-art LED technology. The new flood lamp covers a curing area of 200 x 200 cm with a uniformity of +/- 10%. Due to it’s curing area it‘s particularly suitable for use with wafers and solar cells. The irradiance corresponds to 690 mw / cm2 at 10 mm working distance. The wavelength is 395 nm. The dimensions of the lamp are 280 x 280 x 261 mm including connection.

  • Enovasense thickness measurement system
    The system measures the thickness of non- and semi-transparent layers. Based on thermophysical measurement principles, it‘s suitable for almost all layers on common substrates such as paints, electroplating and metal coating on plastic, wood or glass....

  • Polytec presents the new thickness measurement system from the French manufacturer Enovasense.

    The system measures the thickness of non- and semi-transparent layers. Based on thermophysical measurement principles, it‘s suitable for almost all layers on common substrates such as paints, electroplating and metal coating on plastic, metal, wood or glass.  

    The process suitability is unique, in many areas permitting a 100% quality control where this has not previously been possible: extremely short measurement times of less than one second, the contactless, non-destructive photothermal measurement process, the compact sensor head (75 x 32 x 41 mm) and scalability with the ability to control up to 10 parallel sensor heads all play their part. Robotic arm installation can also be easily used with this system.

    Examples of typical applications can be found in the plastics or metal processing industry for metallic plastic coatings and electroplating or in the aeronautics industry for measurements on coated composite materials. A special, patented application is used in the automotive industry to measure the thickness of metallic cylinder coatings.

    Polytec offers exclusive advice, feasibility studies, sales and service for the German-speaking region.


Send Email

Type your information and click "Send Email" to send an email to this exhibitor. To return to the previous screen without saving, click "Reset".