MPI Corporation

No. 155, Chungho St.
Chupei,  Hsinchu  302

Taiwan
http://mpi-corporation.com
  • Booth: A4102


Probe Card, Probe System, RF Probe, Thermal Test System

Founded in 1995 and headquartered in Hsinchu, Taiwan, MPI Corporation is a global technology leader in Semiconductor, Light Emitting Diode (LED), Photo Detectors, Lasers, Materials Research, Aerospace, Automotive, Fiber Optic, Electronic Components and more. MPI’s four main business sectors include Probe Card, Photonics Automation, Advanced Semiconductor Test and Thermal Divisions. MPI products range from various advanced Probe Card Technologies, Probers, Testers, Material Handlers, Inspection and Thermal Air Systems. Many of these products are accompanied by state-of-the-art Calibration and Test & Measurement software suites. The diversification of product portfolio and industries allows a healthy environment for employee growth and retention. Cross pollination of product technologies allows each new innovation to provide differentiation in areas that are meaningful to our precious customer base.


 Products

  • TS3000-SE Automated Probe System
    TS3000-SE is equipped with MPI ShielDEnvironment™ for ultra-low noise, extremely accurate and highly reliable DC/CV, 1/f, RTS and RF measurements, addressing primarily the needs of the Device Characterization, WLR and RF & mmW applications....

  • MPI TS3000-SE is a 300 mm automated probe system equipped with MPI ShielDEnvironment™ for ultra-low noise, extremely accurate and highly reliable DC/CV, 1/f, RTS and RF measurements, addressing primarily the needs of the Device CharacterizationWafer Level Reliability and RF & mmW applications.

    The exclusive, actively cooled probe platen design provides maximal stability over the wide temperature range from -60° to 300°C and is making the TS3000-SE probe system an excellent choice for testing devices under different thermal conditions.

  • ThermalAir TA5000A/B
    MPI Thermal localized temperature test products are used in applications such as semiconductor, microwave RF and other electronic component product design, development and thermal testing in engineering test....

  • MPI Thermal localized temperature test products are used in applications such as semiconductor, microwave RF and other electronic component product design, development and thermal testing in engineering test. MPI Thermal test systems are portable for bringing temperature capabilities to the test locations and easily integrated into existing test setups. We also design and manufacture thermal chambers, direct contact thermal systems and ultra-cold chillers. Our systems provide wide temperature range from -100°C to +300°C

  • Cobra Probe Card
    MPI Cobra Probe Cards are a widely known fine pitch buckling beam probe card technology. Cobra buckling beam probe is applicable from early engineering pilot-runs to mass production on various wafer probing test applications....

  • MPI Cobra Probe Cards are a proven solution for a variety of semiconductor production tests including on wafer high volume manufacturing (HVM). Based on improved “Buckling Beam” technology – Cobra  , the cards are adapted for bond pad patterns such as full array, semi-array, peripheral and staggered – chip pattern. MPI’s technology has the world best overall cost-of-ownership (COO) for the following DUT packages :

    • Lead-free Bump
    • Copper Pillar (Cu Pillar)
    • Capped Pillar
    • Aluminum Pad

    MPI Cobra Probe Cards include high current carrying capability (CCC) and balanced contact force (BCF) . The technology is compatible with state-of-the-art space-transformer architectures. and is ready for applications requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, microprocessor, industrial microcontrollers, and more.


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