200 mm stand-alone tool
The MicroProf® 200 is the high-performance measuring device for the non-contact and non-destructive characterization of almost all surfaces and films, and has already been employed successfully by many companies. This surface measuring instrument is based on FRT´s established multi-sensor technology and is capable of performing numerous measuring tasks within just one system. A high-resolution CWL sensor allows for easy and reliable measuring of, e.g. topography, roughness and contour. With a wide range of additional sensors it is also possible to adapt the MicroProf® 200 optimally and individually to your measuring task. Using the TTV module for inspection from both sides or using the module for automatic sample handling (MHU), the MicroProf® 200 can also be adapted easily to the customer’s new measurement requirements at any time. Simultaneously, the highest automation requirements get fulfilled.