E+H was founded in 1968 and offers since 1978, for more than 35 years now, a wide variaty of measurement tools for the Semiconductor and PV in process control and laboratory characterization.
Contactless metrology tools for 1" up to 450mm Wafers consisting out of Silicon, Quarz, Sapphire etc, but also solutions for other materials such as plastic displays are available.
Most metrology tools can be integrated into our own full automated wafer handling solutions (belt driven, robot).
This long term support for our customers combined with robust, reliable, mature and low maintenance products makes E+H a strong partner on which you can rely on.
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