NEW High TPUT Automated CD & Overlay measurement system
Introducing the IVS-220 Overlay and CD Metrology System
Reliability and flexibility are the hallmark of the IVS 200 series and on those benchmarks, the IVS 220 is no different. Where the IVS 220 sets itself apart is in the advanced technology that allows for high throughput and outstanding performance in precision and TIS on overlay registration.
Overlay registration, CD, Z height, contact, bump, vernier, in circuit overlay are all possible.
With world wide support, Inspectrology is well positioned to provide the support needed to keep fabs running at peak efficiency.
We specialize in supporting smaller factories where system up-time is critical. We understand the needs to keep up time at 100% and mean time between failures to months and years.
With decades of Metrology experience, the semiconductor professionals at Inspectrology provide full service support, metrology products, metrology standards, and educational training services to fabs worldwide.
Inspectrology provides Metrology System sales and services to fabs in a wide range of market sectors including Microelectromechanical systems (MEMS), Semiconductor, Compound Semi (GaAs, GaN, SiC, SOI, InP, LiNO3 etc), LED (Light Emitting Diode) and Solar.