NEXTIN, a technology leading company in the field of inspection and metrology of semiconductor industry, provides AEGIS, ASTRA wafer inspection system and IRIS TSV inspection system. AEGIS was certificated by SK Hynix and Fraunhofer IPMS through long-term collaboration and is being used for advanced device development and manufacturing.
AEGIS has been recognized as a cost effective and high sensitivity equipment at the most advanced device fabrication in one of the biggest manufacturing companies through long-term collaboration and is being used in mass production for the advanced devices.
AEGIS provides the most cost effective and high sensitivity solution for defect inspection of 1x nm semiconductor process and beyond, and supports 200mm and 300mm wafer in one tool.
IRIS has developed as the solution of TSV inspection with Tunable Single Wavelength Laser at a field.
NEXTIN has been very aggressively developing wafer inspection equipment with own differentiated technology to meet customer’s requirements and also for future devices.