Chroma Ate Europe BV

The Chroma 3111 Tabletop Single Site Test Handler is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts. With its main focus at the System Level Test (SLT) platform, the 3111 handling system is capable of handling a large variety of device types with sizes ranging from 5x5mm to 45x45mm.

With the wide range of chip sizes supported by the Chroma 3111, it also enables high hroughput in order to support the testing of smartphones, tablets, PC's and automotive chipsets allowing for temperature control capabilities from ambient to temperature ceilings of 125℃. Its ideal compact size and product versatility, combined with its low cost per test site allows for expandable test applications throughout your test floor.

To maximize productivity, the 3111 offers a remote access function, allowing the handler to be controlled from any distance and location through an internet connection. Equipped with two software allocatable JEDEC t rays, the 3111 maximi zes the engineering test capability saving both cost and time, doing so within a 60 cm table space footprint. A user-friendly graphical interface (Windows™) system provides a quick and easy device setup changeover, simplifying the process and increasing its efficiency.

The Chroma 52400e series is a PXIe based SMU (Source Measurement Uni t) card designed for highly accurate source or load simulation with precision voltage and current measurements.

The SMU combines four-quadrant operation with precision and high speed measurement. This makes the SMU an ideal instrument in many parametric test applications ranging from ICs, two-leaded components such as sensors, LEDs, laser diodes, transistors, to solar cells, batteries and many other electronic
devices.

The 52400e series features: 16 selectable control bandwidths to ensure high speed output and stable operation; multiple source/ measure ranges with an 18-bit DAC/ADC to provide the best resolution and accuracy available with a sampling rate up to 100K s/S; programmable internal series resistance for battery simulation; ±force, ±sense and ±guards lines to avoid leakage current and reduce settling time -- especially useful for low current test applications.

The 52400e series has a patented hardware sequence engine that uses deterministic timing to control each SMU. The sequencer's on-board memory can store up to 65535 sequencer commands and 32k measurement samples per channel, allowing cross module/ card synchronizat ion and latency free output control and measurement. No PC communication is required during execution of the hardware sequencer test process.

C, C#, LabView, LabWindows APIs and versatile soft front panels come standard with each SMU. The back connectors are compatible with both PXIe and hybrid chassis. All of these features enable easy integration to PXIe or PXI-hybrid systems designed for a wide range of applications.