Surface Particle Detection in Seconds
Technical Cleanliness Control
We enable surface particle contamination and technical cleanliness control according to 6 principles
Fast
Quantitative
Easy to Operate
Accurate
Consistent
High Throughput
Imaging in seconds
Measurement and qualification reports
Operator independent
High-resolution measurement (quantity, position, size)
Objective measurements, time after time
Processing at production line speeds
Particle Contamination Control
Our unique dark field metrology technology and modular system approach allows for a variety of microtechnology applications
Particle Detection and Inspection Products
Discover Fastmicro
Are you ready for the next step in cleanliness control?