Agilent provides analytical instrumentation, software, services, and support for your semiconductor impurities testing needs.
- Inorganic Impurities in Semiconductors : Monitor and control trace and ultra-trace-level metal contaminants in wafers, sputtering targets, process chemicals, photoresists, and electronic gases.
- Organic Impurities in Semiconductors : Performing analysis of trace-level organic impurities
- Particle Analysis in Semiconductors Solutions for monitoring metallic nanoparticles (NPs) and dissolved metals in bulk chemicals and in wafer processing and cleaning baths.
- Photonics & Optoelectronics Devices & Components Analysis : UV-Vis and UV-Vis-NIR spectrophotometers provide complete photonics test and measurement solutions for photonic devices and components.
- Vacuum & Leak Detection in Semiconductors & Electronics : Vacuum pumps and gauges and precise, robust, easy-to-use leak detectors save you time and money.