With DOT800T, SPEA provides a complete solution for power testing, combining in a single machine all the resources to perform ISO, AC, DC tests on the whole range of power applications, from wafer level to final product test.
DOT800T addresses the test requirements of traditional Silicon devices as well as new Gallium Nitride and Silicon Carbide technologies, covering their performance range with the highest voltage and current source capabilities, high frequency and low current measurement capabilities.
The correct device operation is verified under actual working conditions with complete and accurate dynamic tests, static test and isolation test sequences, to guarantee the quality and reliability of every device.
All of this, in a high-throughput, modular and configurable tester, designed for mass-production environments.
DOT800T is based on a multi-core architecture: the tester can be equipped with one to six independent and configurable test cores, to perform ISO test, AC test and DC test on dedicated stations, each of which with a dedicated independent controller. With a single system, you get the power and performance of six powerful testers.