Micro.View and Micro.View+ are the next generation optical surface profilers.
The Focus Finder and Focus Tracker greatly enhance the ease of use under all conditions, and the CST - Continuous Scanning Technology allows for using the entire travel range up to 100 mm as extended measurement range.
Distinguish and document defects and visual distorsions with the latest color information imaging analysis. Quantify surface topography with sub-nanometer resolution and capture the finest details reliably.