Polytec GmbH

Polytec-Platz 1-7
Waldbronn,  D-76337

  • Booth: B1110

Polytec is manufacturer of optically based measurement inst

Polytec provides instruments and components for a variety of semiconductor measurement applications: Four-Point-Probes (sophisticated fully automated systems as well as simple manual systems), CV mapping, optical, photothermal and terahertz layer thickness measurement, UV curing systems and Software for semiconductor equipment and factory automation.

Furthermore the company provides UV-, VIS-, NIR-, Raman- and fluorescence spectroscopy, fiberoptic sensing (temperature, strain, vibration), Laser-Doppler-Vibrometry, MEMS Vibration and Motion Analysis, Wafer-level MEMS Test Solutions, Surface Profilometry and Topography Measurement.


  • Enovasense Layer thickness measurement system
    Contactless transparent and semi-transparent layer thickness measurement under industrial conditions...

  • The laser-based coating thickness measurement system is working completely contact-free. The opaque, semi-transparent or transparent coating is measured from a working distance of 5 to 20 cm using laser and infrared sensors. It is designed for industrial environmental conditions, i.e. also on conveyor belts, at high temperatures and in a wet or brittle condition.

    The measurement is non-destructive and tactile unaffected. The excitation laser generates only slight heating, so that neither the object nor the coating are affected.

    The measurement takes less than a second. It is based on a physical model that allows the system to be pre-calibrated according to the application. The calibration is both faster and easier to implement than with conventional methods. For some applications, calibration can even be omitted entirely.

    The small dimensions of the measuring head (75 x 32 x 41 mm with a weight of 150 g) enable measurements in places that were previously absolutely inaccessible.

  • T-Ray 5000
    TeraMetrix systems provide the platform for precise, non-destructive measurement of thickness, density, basis weight, and thickness of single and multi-layers. They are based on terahertz measurement technology....

  • The T-Ray 5000 systems are among the fastest terahertz measurement systems available on the market. It can measure thickness down to 50 microns at a rate of 1,000 measurements per second without nuclear or ionizing radiation.

    Typical applications are

    • Industrial process control for real-time measurements in continuous manufacturing applications
    • Quality control and non-destructive testing (NDT) for high precision, reproducibility and repeatability
    • Imaging through material, terahertz waves penetrate most materials and can easily reveal defects such as voids, cracks and density variations
    • Spectroscopic measurements, with pulsed time-domain terahertz data, objects such as explosives and biological agents can be spectroscopically determined

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