UnitySC: Inspection & Metrology leader: elevate your yield!
UnitySC, based in Montbonnot, France, is a globally recognized leader in inspection and metrology. We seamlessly integrate advanced technologies to empower customers for higher yields and faster time-to-market. Our expertise includes standardized and customized solutions tailored to various sectors, revolutionizing process control.
We pioneer cutting-edge metrology tools for Advanced Packaging, covering TSVs, High BandWidth Memory Chip stacks, Hybrid-Bonding/Wafer2Wafer, and Die2Wafer. We excel in equipment for defect inspection on unpatterned wafers, serving diverse substrates like GaN, GaAs, InP, SiC, Glass, Sapphire, Ge, and Silicon. Our comprehensive portfolio spans Metrology and Inspection equipment for diverse applications, driving yield improvements.
At UnitySC, we prioritize diversity and talent support, attracting industry professionals. Leveraging advanced technologies like 3D-imaging microscopy and spectrometry, we optimize process yields.
We serve semiconductor leaders worldwide, providing unwavering support across Europe, Korea, Singapore, Taiwan, Japan, the USA, and China. UnitySC is your trusted partner for semiconductor inspection and metrology excellence.