Euris GmbH

Waldmeisterstrasse 72
Muenchen,  Bavaria  D-80935

Germany
http://www.euris-semiconductor.com
  • Booth: C1258

Machines, Equipment and Consumables for Semiconductor and PV

ARRADIANCE: ALD, Atomic Layer Deposition

CAMTEK / FRT: Non-Contact Optical Surface and Form Metrology, Broadest

CORNING TROPEL: Non-Contact Optical Metrology / Laser Interferometer

DDL: Dynamic GaN (Power and RF) Device Measurement Systems

ELECTRONIC CONTAINER: Wafer Carrier / Shipper

EURIS: Diamond Scrub Pads, Single Wafer Boxes, 2kW lamps for High-Temperature Epi-Processes,

FORMFACTOR: Cryogenics and Test Products for Quantum Industry

GET CONTROL: E84 /Environmental Monitoring

JANDEL: 4 Point Probe Heads and Source-Meter

LAMBDA–MICROCURE: Variable Frequency Microwave Curing

LUMETRICS: Optical Layer Thickness for Medical Devices, Ophthalmic, Glass

MICROTECH: WET Stations, Gradient Dryer, Chemical Dispense

NANOSYSTEM: Optical 3-D Profiler for Roughness / Form; PCB Inspection

NAPSON: Sheet resistance / Resistivity with 4-pp and Eddy-Current / Carrier Lifetime Measurement

OKAMOTO: Machines for Grinding, Lapping, Polishing, CMP and TSV Processes / Ingot Grinder with XRA

TMC / AMETEK: Precision Vibration Isolation Systems

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