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Bruker Corporation

112 Robin Hill Rd
Santa Barbara,  CA  93117-3107

United States
https://www.bruker.com/en/products-and-solutions/semiconductor-solutions.html
  • Booth: C1800

Categories

202 Other Equipment
  • Repair; Rework Equipment
    • 203 Inspection & Measurement Products
  • Defect; Particle; Bump; Contamination Detection, Review or Inspection
  • Film Thickness; Thickness; Uniformity Measurement; Ellipsometer
  • Line Width; Critical Dimension (CD) Measurement
  • Microscopes: Atomic Force Microscopes (AFM)
  • Stress; Refractive Index; Reflectivity & Conductivity Measurement
  • Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation
  • X-ray; XRF; 3-D X-Ray; LEXES Systems

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