Park Systems is a world-leading manufacturer of nanometrology tools for surface analysis at nanoscale, ranging from atomic force microscopy to imaging ellipsometry.
The industrial automated AFM product line from Park Systems offers the leading nano metrology solutions for 3D surface characterization, failure analysis and large sample research. In utilizing the True Non-Contact Mode™, Park AFMs enable non-destructive measurement of soft photoresist surfaces with high aspect ratio tips. Proven SmartScanTM operation software and Single Click-AFM automation eliminates any need for sample adjustment and makes the scanning process as efficient and user-friendly as possible. AFM tools from Park Systems are trusted to deliver ultra-high resolution, unparalleled reproducibility, and extremely precise measurements quickly and easily.
Contact:
Park Systems Europe GmbH
Schildkroetstrasse 15, 68199 Mannheim, Germany
+49 621 490-896-50 pse.sales@parksystems.com
www.parksystems.com