Welcome to Booth No.: C2868 for live demo of wafer mapping
SURAGUS develops non-destructive testing devices for innovative measurement tasks based on the eddy current technology. The EddyCus® series enable both inline and offline characterization of functional thin-films, metal coatings, wafer and bulk materials. There are different testing devices such as single-point measurement devices, inline systems, and mapping solutions to fulfill the respective testing task adequately. SURAGUS also offers conductivity mappings for defect identification and quality assurance of single and multi-layer systems.