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Microtest

Via della Galeotta 9A
Altopascio (LU),  I-55011

Italy
https://www.microtest.net
  • Booth: C2447


Welcome to Microtest page! Looking for a testing partner?

The Microtest Group offers testing products and services for the semiconductor ecosystem

The Microtest Group operates in the semiconductor eco-system, providing best-in-class ATE, Test Services, and ASIC design for the automotive, industrial, power, sensor and healthcare markets. Microtest is the ideal company to optimize business operations and reduce testing costs; leveraging 25 years of advanced performance, high parallelism, and pioneering automation. The Microtest Group is headquartered in Europe, Italy with support globally, and remains committed to innovation, service, and quality. www.microtest.net

 Products

  • Microtest_Hatina GP
    The HATINA GP system has been designed for testing mixed-signal devices; its performance is best compared to state-of-the-art testers. Multisite efficiency and very high parallelism to reduce test time and decrease energy consumption....

    • The HATINA GP system has been designed for testing mixed-signal devices; its performance is best compared to state-of-the-art testers.

    The most compact size currently on the market with performance best compared to bigger state-of-the-art testers.

    Multisite efficiency and very high parallelism to reduce test time and decrease energy consumption.

    Details :
    • Suitable for EWS and final test
    • Multiplexer to increase productivity
    • Low weight and dimensions
    • Capable to test incredibly complex devices
    • Revolutionary sw tools
  • Microtest_VIP EXTENDED
    Microtest innovative equipment for testing power devices by increasing parallelism (up to 48/96 site in single configuration). By pairing up 4 VIP Extended, you can test up to 400 vi-power e smart power devices in parallel!...

    • Our Hatina WS family is now larger thanks
    to our newest extraordinary equipment.

    Microtest newest innovative equipment for testing power devices increasing parallelism (up to 48/96 site in single configuration).

    By pairing up 4 VIP Extended, you can test up to 400 vi-power e smart power devices in parallel!

    Details

    Automatic Test equipment for EWS, Instrip and final test for :

    • High side and low side driver devices
    • IGBT
    • Power MOS
    • Smart Power
    Main Features
    • Up to 48 sites
    • Up to 200 A
    • Extremely high production rates
    • Quick maintenance
    • Low footprint
    • Incredibly low cost per site
    • Up to 3 kV
    • Higher with Ping Pong configuration
  • Microtest_DMT
    DMT system for a tailored testing solution. Small footprint due to high integration of hardware, ultra high-density tester. More resources than a standard big footprint tester in a limited space....

    • DMT system for a tailored testing solution. Small footprint due to high integration of hardware, ultra high-density tester. More resources than a standard big footprint tester in a limited space.

    The first and unsurpassed desk ATE!

    An innovative system for tailored testing solutions.

    Ultra high-density tester (up to 124 sites combined with Hatina GP).

    Details:
    • Lowest footprint on the market
    • Automatic code generator
    • Drastically reduces the time to market
    • Validation of new ICs in few weeks
    • Revolutionary software tools
    • Integrated oscilloscope for debug
  • Microtest_Turret
    Microtest testing at finishing is an equipment to perform several test on a station of a turret handler for semiconductor IC. The smallest on the market. ...

    • Microtest testing at finishing is an equipment to perform several test on a station of a turret handler for semiconductor IC.

    The smallest on the market.

    Details :
    • High pin count devices testing
    • Discrete devices testing
    • Multiple independent stations running with the same control unit
    • Test development conversion service available
    • Independent test flows running on each station
    • 0-footprint, Low Cost
  • Microtest_Hatina 4s
    Hatina platform is able to drive and produce different stimuli, and perform devices testing, both at wafer level and final test. Hatina 4S can be adapted to all major handlers, where stimuli are already available....

    • Very compact solution for MEMS device testing.

    Increase production throughput and reduce costs because it allows the qualification of different types of devices without changing interface board.

    Hatina platform is able to drive and produce different stimuli, and perform devices testing, both at wafer level and final test.
    Hatina 4S can be adapted to all major handlers, where stimuli are already available.
     

    Different configurations for different types of test
  • Microtest_Ovenless Burn-In & HTOL solution
    The Microtest Ovenless Burn in is a powerful and innovative solution for Burn-in, that allows the maximum flexibility to match your needs. The first ovenless burn-in on the market....

    • The Microtest Ovenless Burn in is a powerful and innovative solution for Burn-in, that allows the maximum flexibility to match your needs.

    The first ovenless burn-in on the market!

    The Microtest Burn-in is an innovative and fully automatic solution that allows to drastically reduce industrial costs.

    Main Features
    • Heater embedded for each DUT
    • Up to 24 Burn-in Boards per system
    • Up to 120 devices per board
    • Automatic loader compatibility
    • Small footprint
    • DUT heater independent control
    • Very low power consumption
    • High reliability and accuracy
    • NO BID under temperature

Categories

208 Test Equipment
  • Burn-In Systems
  • Discrete Component Test Systems
  • Environmental Stress Systems - Temperature; Humidity; Pressure; HAST
  • Failure Analysis Systems
  • Functional Test Systems
  • Handlers; Positioner Systems
  • Linear Test Systems
  • Logic Test Systems
  • Package Test Systems
  • Parametric Test Systems
  • Probe Card Maintenance and Analysis Systems
  • System on a Chip (SOC); Mixed Signal Test Systems
    • 309 Test Materials
  • Burn-In Boards; Performance Boards (incl. Low; High Temp and Ceramic)
  • Probe Cards; DUT boards and other probing accessories (incl Ceramic and Special Purpose Probe Cards)
  • Structural Circuits; Test; Thermal Fixturing
  • Test Sockets; Contactors and Contact accessories
    • 601 Design Software
  • EDA - Electronic Design Automation; Circuit Design
    • 602 Manufacturing Software
  • Test Programs
  • Yield Mgmt; Process Control Software
    • 603 Simulation, Analysis; Modeling Software
  • Simulation; Characterization; Verification Software
    • 700 Manufacturing Services
  • Burn-In Service
  • Failure Analysis and other Analytical Services
    • 701 Manufacturing Services or Consulting
  • Circuit Design; Electronic Design Services (EDS); System Level Design (SLD)
  • Test Services or Consulting
    • 805 PV Services
  • Research and Development
  • Testing Institutes
    • 902 Other
  • Other

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