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Polytec GmbH

Polytec-Platz 1-7
Waldbronn,  D-76337

Germany
http://www.polytec.com
  • Booth: C2532


Polytec provides measurement equipment and optical sources

For more than 50 years and with more than 400 employees worldwide, the high-tech company Polytec has been developing, producing and selling optical measurement  technology for research and industry. This includes systems for vibration measurement, surface characterization, length and speed measurement and process analytics and optical systems.

Polytec provides instruments and components for a variety of semiconductor measurement applications: Four-Point-Probes for sheet resistance, photothermal and terahertz layer thickness measurement, hyperspectral electrical characterization of sheet resistance, carrier mobility and dielectrical parameters as well as UV curing systems and IR reference sources.


 Products

  • Photothermal coating thickness measurement system
    The laser-based coating thickness measurement system from Enovasense/Polytec works absolutely contactless. Lasers and infrared sensors are used to measure the opaque, semi-transparent or transparent coating from working distances of 5 to 20 cm....

  • The laser-based coating thickness measurement system from Enovasense/Polytec works absolutely contactless. Lasers and infrared sensors are used to measure the opaque, semi-transparent or transparent coating from working distances of 5 to 20 cm. And it does this under industrial environmental conditions, i.e. also on conveyor belts, at high temperatures and in wet or brittle conditions.

    Non-destructive

    Non-destructive means: completely unaffected by tactile influences. The excitation laser generates only slight heating, so that neither the object nor the coating are affected or even damaged during the measurement.

    Fast

    The measurement itself takes less than a second. The Enovasense process is based on a physical model that allows the system to be pre-calibrated according to the application. Calibration is both faster and easier to realize than with conventional methods. For some applications, calibration can even be omitted altogether.

    Compact

    The small dimensions of the measuring head (75 x 32 x 41 mm with a weight of 150 g) enable measurements to be taken in places that were previously completely inaccessible.


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