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INFICON GmbH

Bonner Strasse 498
Cologne,  50968

Germany
http://www.inficon.com/
  • Booth: B1734

INFICON is a leading provider of innovative instrumentation, critical sensor technologies, and Smart Manufacturing/Industry 4.0 software solutions that enhance productivity and quality of tools, processes, and complete factories. These analysis, measurement and control products are essential for gas leak detection in air conditioning/refrigeration and automotive manufacturing.

They are vital to equipment manufacturers and end-users in the complex fabrication of semiconductors and thin film coatings for optics, flat panel displays, solar cells and industrial vacuum coating applications.

Other users of our vacuum-based processes include the life sciences, research, aerospace, packaging, heat treatment, laser cutting and many other industrial processes. We also leverage our expertise in vacuum technology to provide unique, toxic chemical analysis products for emergency response, security, and environmental health and safety.


 Products

  • Factory Operations Optimization
    Digital Twin Enabled Smart Scheduling and Operations Optimization...

  • For detailed information about all products for factory optimization please visit our website.

  • Process Control and FDC
    Collect the Right Information - Analyze the Right Data - Make the Right Decisions...

  • Innovative process control and decision support software

    Smart Manufacturing through innovative process control and decision support software.

    The most comprehensive and advanced Process Control and Maintenance Management Software Suite for the electronics manufacturing industry.  Our solutions are proven to increase capital productivity, labor efficiency and overall factory efficiency by detecting and predicting excursions, automating complex decision making, and delivering industry-leading process control capability.

    For detailed information please visit our website.

  • SMART-Spray Helium Spray Gun
    For Simplified Handling with our UL Family of Leak Detectors...

  • Revolutionarily Easy Leak Detection with Portable Helium Spray Gun

    With our intelligent add-on SMART-Spray, a mobile, wire- and hoseless helium spray gun for the UL Family of leak detectors, you can elevate your leak detection to new heights:

    Working with SMART-Spray makes your leak detection significantly faster, easier, more reliable and more effective while saving helium.Eliminating the connection hose and operation errors: SMART-Spray Helium Spray Gun makes leak testing more flexible and efficient than ever before. Forget time-consuming handling of bulky helium cylinders, working range limitation by a hose connection and error-prone manual adjustment of the helium flow. 

    SMART-Spray is fully compatible with the UL Family of vacuum leak detectors. The main application is spray pin pointing in the semiconductor industry.

  • Transpector® APX Multi-Pressure
    Advanced Process Expert for Multi-Pressure ALD/CVD and Etch...

  • Minimize Scrap and Maximize Yield in Real Time

    INFICON Transpector APX remains the market leading Residual Gas Analyzer (RGA) for semiconductor and display process monitoring. INFICON knows semiconductor and display customers have unique needs, and the latest revision of the Transpector APX allows for more flexibility to meet specific application requirements, while maintaining industry leading measurement speed and sensitivity. Transpector APX is the ideal RGA process monitor for semiconductor processes such as ALD, CVD, PVD, and Etch.

    The next generation Transpector APX Multi-Pressure inlet system is designed to survive process chemistries prone to particle or coating generation like ALD or PECVD. This allows for continuous monitoring to capture data points at all critical process steps. In addition the HexBlock inlet is available with INFICON proprietary coating for resistance to corrosive gases, essential for chamber clean endpoint monitoring applications.

    Advantages

    • Application specific platform design for longest lifetime on your ALD or CVD process for the best wafer and panel protection and process optimization
    • ALD ready with measurement speeds of over 550 data points per second
    • Reduced fab footprint by 30% and easier installation due ne high performance pumping system
    • Configurable HexBlock™ with INFICON proprietary coating with up to three pressure inlets that can withstand harsh corrosive chemistry
    • Automated calibration ensures long-term data reliability and accuracy for sensor to sensor and tool to tool chamber matching
    • Transpector APX becomes a powerful process monitoring and diagnostics tool when integrated with FabGuard® software and supported by INFICON world-class application experts

    For more information about our full range of Mass Spectrometers go to: https://www.inficon.com/en/products/gas-analysis/mass-spectrometers  

  • UL3000 Fab Series
    Mobile Helium Leak Detectors with ULTRATEST™ sensor technology...

  • Mobile Helium Leak Detectors: Specifically designed for the needs of leak checking in semiconductor applications.

    They feature flexibility, mobility, fast start up, high sensitivity, fast and precise test results, and reliability.

    • Faster pump down (evacuation) times due to higher air pumping speed.
    • Lower total cost of ownership (TCO) due to low maintenance roots roughing pump.
    • Start leak checking earlier as HYDRO·S software eliminates the water vapor background, making it possible to quickly reach sensitive measurement ranges
    • The UL3000 Fab ULTRA leak detector offers also an improved sniffer capability by using the well proven sniffer line SL3000 which has up to 10 m length. The SL3000 has a separate connection port, thus no connection to the vacuum inlet is required.

    Fast Results 

    The improved vacuum system with low maintenance vacuum pumps allows the detection of leaks starting from atmospheric pressure. The rugged mass spectrometer system ensures long running time and low maintenance costs.

    Rotatable Display and Remote Controllable User Interface

    The innovative touch screen display shows test results and status information even from a long distance. Easy operation via user guided menu structure, even for inexperienced operators. A wireless control of the UL3000 Fab (ULTRA) helium leak detector is possible via smartphone or tablet - without special software or Apps. Recording and storage of test results via push button can be transferred to other storage media for further analysis.

    Slim Design for Advanced Maneuverability

    A low center of gravity, big wheels, ergonomically designed handle and the slim housing enable good mobility of the UL3000 Fab (ULTRA) even in tight spaces.

    Optimized Leak Testing with SMART-Spray, I·BOOST and SPRAY-Check

    SMART-Spray helium spray gun enhances leak checking by eliminating the need for large helium cylinders and cumbersome hoses. It streamlines the process, reducing manual helium flow adjustments and minimizing errors. This tool makes leak detection faster, easier, and more reliable while maintaining low helium consumption and background levels. Ideal for efficient and precise leak testing.

    I·BOOST offers up to 50% time savings in leak detection. With shorter response times, it delivers fast and precise measurements across various chamber volumes, enhancing efficiency and accuracy. Additionally , SPRAY-Check, a spray on test leak, ensures the functionality and readiness of your leak detector. Ideal for the 10⁻⁹ to 10⁻⁸ mbar∙l/s range, it provides reliable checks during testing processes.

  • SemiQCM® SR
    Sensors for Precursor Monitoring Making Excellence Repeatable...

  • Protect and Grow Your Profit with Precision Rate and Thickness Monitoring

    The SemiQCM SR sensor is one component of a system for precursor monitoring, with the other components being an IMM-200 and FabGuard (version 19.12.00-a or higher).

    Semi Process Monitoring can be used in semiconductor applications for endpoint detection and fault elimination by monitoring the amount of precursor in the foreline or chamber exhaust. The use of an in situ QCM provides affordable process monitoring and improved semiconductor process profitability.

    The failure to deliver precursor to a wafer can be detected in as little as one wafer.

    Advantages

    • Real-time, in situ process monitoring
    • Prevent over-etching, identify chamber clean end point
    • Identify equipment or process state fault

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