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HTT High Tech Trade GmbH

Landsbergerstraße 428
Munich,  D-81241

Germany
https://www.httgroup.eu
  • Booth: B1102

Categories

200 Packaging and Assembly Equipment
  • Cut & Down Set; Trim; Form Equipment
  • Device Handling; Feeding Systems
  • Die Sorter; Pick & Place; Flip Chip Placement Systems
  • Solder Reflow; Soldering & Brazing Equipment
  • Wafer Mount; Taping Equipment
    • 202 Other Equipment
  • Heating; Annealing; Curing Equipment - Furnaces; Conveyors; Ovens; Test Chambers; Heat Treating
  • Vision; ID; Bar Code Systems
    • 203 Inspection & Measurement Products
  • Defect; Particle; Bump; Contamination Detection, Review or Inspection
  • Die Inspection; Die Shear
  • Film Thickness; Thickness; Uniformity Measurement; Ellipsometer
  • Flat; Notch Finding System
  • Microscopes: Optical Microscopes
  • Package Inspection; Lead Scanners
  • Particle Monitors; Analyzers - Airborne or Liquid
  • Resistivity Measurement; 4 point probe; Sheet resistance
  • Thermal Sensing, Measurement, Analysis
  • Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation
  • X-ray; XRF; 3-D X-Ray; LEXES Systems
    • 207 Process Equipment
  • Deposition; Chemical Vapor (CVD); MOCVD; PECVD; LPCVD; ALD; REALD; MVD
  • Deposition; Physical Vapor (PVD); Sputtering; Evaporation Equipment
  • Transfer Systems for Wafer; Reticles or FPD's
  • Wafer Identification; Marking Equipment
    • 208 Test Equipment
  • Burn-In Systems
  • Discrete Component Test Systems
  • Environmental Stress Systems - Temperature; Humidity; Pressure; HAST
  • ESD; EMS and Latch-up Systems
  • Failure Analysis Systems
  • Handlers; Positioner Systems
  • Optical Test Systems
  • Package Test Systems
  • Probe Card Maintenance and Analysis Systems
  • Probing Equipment incl. Analytical; Circuit; Manual; E-Beam; Optical; Wafer Probers
  • Test Contactor Cleaning; Conditioning Systems
  • Test Head Manipulators and Docking Stations
    • 309 Test Materials
  • Burn-In Boards; Performance Boards (incl. Low; High Temp and Ceramic)
  • Probe Cards; DUT boards and other probing accessories (incl Ceramic and Special Purpose Probe Cards)
  • Structural Circuits; Test; Thermal Fixturing
    • 400 Components, Parts & Accessories
  • Chucks for Wafer and other Substrates
  • Lamps for Lithography
  • Vacuum Systems Components & Accessories (optical monitors; Sputtering target fixtures; lubricants
    • 401 Sub-systems
  • Cameras - Still; CCD; Video & Monitors
  • Pumps, for Fluids
    • 700 Manufacturing Services
  • Calibration & Reference Standards
  • Certification; Compliance; Independent Laboratories
  • Failure Analysis and other Analytical Services
  • Used; Rental Equipment; Inventory Reduction, Appraisal - Brokers; Resellers

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