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Shandong Prime-Rel Electronic Technology Co., Ltd.

10th Floor, Building A2, Jiulong Lake International Enterprise Headquarters Park, Jiangning district
Nanjing,  Jiangsu  264300

China
  • Booth: C2232

Prime-Rel Electronic Technology Co., Ltd is a high-tech enterprise specialized in the independent research, development and manufacturing of semiconductor power device testing equipment. We offer a wide range of products, covering reliability(HTXB, HAST, H3TXB), parameter (dynamic, static, insulation withstand voltage), power cycling (PCmin, PCsec), and reactive aging test system.

With the advantages of high integration, customizability and modularization, the company's products have served more than 100 well-known units including semiconductor power device design, manufacturing, packaging, third-party testing institutions and university research institutes. The core team of the company has gathered a series of outstanding talents, including those from the Chinese Academy of Sciences, renowned foreign semiconductor enterprises and overseas industry experts. It owns more than 150 intellectual property rights and has passed the national ISO9001 quality management system certification. It has been awarded the titles of "Little Giant" enterprise as well as gazelle enterprise.​

 Products

  • Power Device Dynamic Characteristic Test System
    The AVATAR-D series products are primarily used for double pulse testing, short-circuit safe operating area (SCSOA), and reverse-bias safe operating area (RBSOA) testing of devices such as IGBT, DIODE, and MOSFET....

    • The AVATAR-D series products are primarily used for double pulse testing (DPT, including turn-on characteristics, turn-off characteristics testing, reverse recovery characteristics testing), short-circuit safe operating area (SCSOA), and reverse-bias safe operating area (RBSOA) testing of devices such as IGBT, DIODE, and MOSFET. The test procedure fully complies with the international standard IEC60747-9, IEC60747-8 and IEC60747-2.

    Suitable for both mass production and laboratory use, the system has been long-term validated by multiple automotive-grade IGBT and SiC module manufacturers, demonstrating exceptional robustness and stability.

  • Power Device Static Characteristic Test System
    The AVATAR-S series products are primarily used for testing the static parameters of devices, such as IGBT, SiC, and MOSFET. The test procedure fully complies with the IEC60747-9 international standard....

    • The AVATAR-S series products are primarily used for testing the static parameters (ICES + VTH + IGES + VF + VCE(sat) + V(BR)CES + GFS + Kelvin) of devices such as IGBT,SiC, and MOSFET. The test procedure fully complies with the IEC60747-9 international standard.

  • Automotive Grade Module Reactive/Active Aging Test
    The Maxwell-pro system is designed for reactive power aging tests on automotive-grade power devices before delivery....

    • The Maxwell-pro system is designed for reactive power aging tests on automotive-grade power devices before delivery. It simulates the working conditions of power modules in new energy vehicles, including vehicle startup, hill-climbing, acceleration, deceleration, and continuous operation, and has locked-rotor testing capabilities to eliminate early-failure devices and study device performance in extreme conditions.

Categories

208 Test Equipment
  • Burn-In Systems
  • Environmental Stress Systems - Temperature; Humidity; Pressure; HAST
    • 701 Manufacturing Services or Consulting
  • Test Services or Consulting

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